METHOD FOR MEASURING STATE OF SKIN WRINKLES

Chil Hwan Oh (Inventor)

Research output: Patent

Abstract

피부주름의 상태 측정장치
Original languageEnglish
Patent number10-0216502
Publication statusPublished - 1999 May 31

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Oh, C. H. (1999). METHOD FOR MEASURING STATE OF SKIN WRINKLES. (Patent No. 10-0216502).

METHOD FOR MEASURING STATE OF SKIN WRINKLES. / Oh, Chil Hwan (Inventor).

Patent No.: 10-0216502.

Research output: Patent

Oh, CH 1999, METHOD FOR MEASURING STATE OF SKIN WRINKLES, Patent No. 10-0216502.
Oh CH, inventor. METHOD FOR MEASURING STATE OF SKIN WRINKLES. 10-0216502. 1999 May 31.
Oh, Chil Hwan (Inventor). / METHOD FOR MEASURING STATE OF SKIN WRINKLES. Patent No.: 10-0216502.
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