Methodologies to observe and characterize interfacial reaction products in (A12O3)p/A1 and SiCp/Al composites - Using SEM, XRD, TEM

Jae-chul Lee, Jung Ill Lee, Ho In Lee

Research output: Contribution to journalArticle

34 Citations (Scopus)
Original languageEnglish
Pages (from-to)721-726
Number of pages6
JournalScripta Materialia
Volume35
Issue number6
DOIs
Publication statusPublished - 1996 Sep 15
Externally publishedYes

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X ray crystallography
Surface chemistry
Reaction products
Silicon carbide
Electron diffraction
silicon carbides
reaction products
aluminum alloys
Chemical reactions
Aluminum alloys
chemical reactions
dissolving
Dissolution
Alumina
electron diffraction
aluminum oxides
Crystal structure
methodology
Transmission electron microscopy
transmission electron microscopy

ASJC Scopus subject areas

  • Materials Science(all)
  • Electronic, Optical and Magnetic Materials
  • Metals and Alloys

Cite this

Methodologies to observe and characterize interfacial reaction products in (A12O3)p/A1 and SiCp/Al composites - Using SEM, XRD, TEM. / Lee, Jae-chul; Lee, Jung Ill; Lee, Ho In.

In: Scripta Materialia, Vol. 35, No. 6, 15.09.1996, p. 721-726.

Research output: Contribution to journalArticle

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