Micro interaction metrics for defect prediction

Taek Lee, Dong Gyun Han, Sunghun Kim, Hoh In

Research output: Chapter in Book/Report/Conference proceedingConference contribution

64 Citations (Scopus)

Abstract

There is a common belief that developers'behavioral interaction patterns may affect software quality. However, widely used defect prediction metrics such as source code metrics, change churns, and the number of previous defects do not capture developers'direct interactions. We propose 56 novel micro interaction metrics (MIMs) that leverage developers'interaction information stored in the Mylyn data. Mylyn is an Eclipse plug-in, which captures developers'interactions such as file editing and selection events with time spent. To evaluate the performance of MIMs in defect prediction, we build defect prediction (classification and regression) models using MIMs, traditional metrics, and their combinations. Our experimental results show that MIMs significantly improve defect classification and regression accuracy.

Original languageEnglish
Title of host publicationSIGSOFT/FSE 2011 - Proceedings of the 19th ACM SIGSOFT Symposium on Foundations of Software Engineering
Pages311-321
Number of pages11
DOIs
Publication statusPublished - 2011 Sep 30
Event19th ACM SIGSOFT Symposium on Foundations of Software Engineering, SIGSOFT/FSE'11 - Szeged, Hungary
Duration: 2011 Sep 52011 Sep 9

Other

Other19th ACM SIGSOFT Symposium on Foundations of Software Engineering, SIGSOFT/FSE'11
CountryHungary
CitySzeged
Period11/9/511/9/9

Fingerprint

Defects

ASJC Scopus subject areas

  • Software

Cite this

Lee, T., Han, D. G., Kim, S., & In, H. (2011). Micro interaction metrics for defect prediction. In SIGSOFT/FSE 2011 - Proceedings of the 19th ACM SIGSOFT Symposium on Foundations of Software Engineering (pp. 311-321) https://doi.org/10.1145/2025113.2025156

Micro interaction metrics for defect prediction. / Lee, Taek; Han, Dong Gyun; Kim, Sunghun; In, Hoh.

SIGSOFT/FSE 2011 - Proceedings of the 19th ACM SIGSOFT Symposium on Foundations of Software Engineering. 2011. p. 311-321.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Lee, T, Han, DG, Kim, S & In, H 2011, Micro interaction metrics for defect prediction. in SIGSOFT/FSE 2011 - Proceedings of the 19th ACM SIGSOFT Symposium on Foundations of Software Engineering. pp. 311-321, 19th ACM SIGSOFT Symposium on Foundations of Software Engineering, SIGSOFT/FSE'11, Szeged, Hungary, 11/9/5. https://doi.org/10.1145/2025113.2025156
Lee T, Han DG, Kim S, In H. Micro interaction metrics for defect prediction. In SIGSOFT/FSE 2011 - Proceedings of the 19th ACM SIGSOFT Symposium on Foundations of Software Engineering. 2011. p. 311-321 https://doi.org/10.1145/2025113.2025156
Lee, Taek ; Han, Dong Gyun ; Kim, Sunghun ; In, Hoh. / Micro interaction metrics for defect prediction. SIGSOFT/FSE 2011 - Proceedings of the 19th ACM SIGSOFT Symposium on Foundations of Software Engineering. 2011. pp. 311-321
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