The microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers was investigated. The thickness effect of NiO and NiFe on the microscopic domain structure and magnetization reversal in a unidirectional and isotropic exchange-coupled films were also studied. The results showed that the density of the cross-type domain was found to be proportional to exchange basing field.
|Journal||Digests of the Intermag Conference|
|Publication status||Published - 2002|
|Event||2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands|
Duration: 2002 Apr 28 → 2002 May 2
ASJC Scopus subject areas
- Electrical and Electronic Engineering