Microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers

D. G. Hwang, J. K. Kim, S. S. Lee, Hyun Cheol Koo, S. H. Chung, Michael Dreyer, R. D. Gomez

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers was investigated. The thickness effect of NiO and NiFe on the microscopic domain structure and magnetization reversal in a unidirectional and isotropic exchange-coupled films were also studied. The results showed that the density of the cross-type domain was found to be proportional to exchange basing field.

Original languageEnglish
Title of host publicationDigests of the Intermag Conference
Publication statusPublished - 2002
Externally publishedYes
Event2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands
Duration: 2002 Apr 282002 May 2

Other

Other2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG
CountryNetherlands
CityAmsterdam
Period02/4/2802/5/2

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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    Hwang, D. G., Kim, J. K., Lee, S. S., Koo, H. C., Chung, S. H., Dreyer, M., & Gomez, R. D. (2002). Microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers. In Digests of the Intermag Conference