Microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers

D. G. Hwang, J. K. Kim, S. S. Lee, H. Koo, S. H. Chung, Michael Dreyer, R. D. Gomez

Research output: Contribution to journalConference articlepeer-review

Abstract

The microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers was investigated. The thickness effect of NiO and NiFe on the microscopic domain structure and magnetization reversal in a unidirectional and isotropic exchange-coupled films were also studied. The results showed that the density of the cross-type domain was found to be proportional to exchange basing field.

Original languageEnglish
Pages (from-to)ES04
JournalDigests of the Intermag Conference
Publication statusPublished - 2002
Externally publishedYes
Event2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands
Duration: 2002 Apr 282002 May 2

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers'. Together they form a unique fingerprint.

Cite this