@inproceedings{1e08fd31d89a418497bc9bb3ecbbc33e,
title = "Microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers",
abstract = "The authors studied the thickness effect of NiO and NiFe on the microscopic domain structure and magnetization reversal in unidirectional and isotropic exchange-coupled NiO(0-60 nm)/NiFe(5-10 nm) films using magnetic force microscopy. As the NiO thickness increases, the microscopic domain structure of the unidirectional biased film changed from a mesh-type ripple pattern with no NiO to a more complicated and coarse-grained ripple structure at 60 nm. On the other hand, for the isotropic exchange coupled film, we observed a new cross-type domain with out-of plane magnetization.",
author = "Hwang, {D. G.} and Kim, {J. K.} and Lee, {S. S.} and H. Koo and Chung, {S. H.} and M. Dreyer and Gomez, {R. D.}",
note = "Publisher Copyright: {\textcopyright}2002 IEEE.; 2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 ; Conference date: 28-04-2002 Through 02-05-2002",
year = "2002",
doi = "10.1109/INTMAG.2002.1001190",
language = "English",
series = "INTERMAG Europe 2002 - IEEE International Magnetics Conference",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
editor = "J. Fidler and B. Hillebrands and C. Ross and D. Weller and L. Folks and E. Hill and {Vazquez Villalabeitia}, M. and Bain, {J. A.} and {De Boeck}, Jo and R. Wood",
booktitle = "INTERMAG Europe 2002 - IEEE International Magnetics Conference",
}