Microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers

D. G. Hwang, J. K. Kim, S. S. Lee, Hyun Cheol Koo, S. H. Chung, M. Dreyer, R. D. Gomez

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The authors studied the thickness effect of NiO and NiFe on the microscopic domain structure and magnetization reversal in unidirectional and isotropic exchange-coupled NiO(0-60 nm)/NiFe(5-10 nm) films using magnetic force microscopy. As the NiO thickness increases, the microscopic domain structure of the unidirectional biased film changed from a mesh-type ripple pattern with no NiO to a more complicated and coarse-grained ripple structure at 60 nm. On the other hand, for the isotropic exchange coupled film, we observed a new cross-type domain with out-of plane magnetization.

Original languageEnglish
Title of host publicationINTERMAG Europe 2002 - IEEE International Magnetics Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)0780373650, 9780780373655
DOIs
Publication statusPublished - 2002
Externally publishedYes
Event2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 - Amsterdam, Netherlands
Duration: 2002 Apr 282002 May 2

Other

Other2002 IEEE International Magnetics Conference, INTERMAG Europe 2002
CountryNetherlands
CityAmsterdam
Period02/4/2802/5/2

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering
  • Surfaces, Coatings and Films

Cite this

Hwang, D. G., Kim, J. K., Lee, S. S., Koo, H. C., Chung, S. H., Dreyer, M., & Gomez, R. D. (2002). Microscopic domain structure in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers. In INTERMAG Europe 2002 - IEEE International Magnetics Conference [1001190] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/INTMAG.2002.1001190