Microscopic domain structures in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers

D. G. Hwang, J. K. Kim, S. W. Kim, S. S. Lee, H. Koo, S. H. Chung, M. Dreyer, R. D. Gomez

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

The dependence on nickel oxide thickness in unidirectional and isotropic exchange-coupled NiO/NiFe bilayer films was investigated by magnetic force microscopy to better understand exchange biasing at microscopic length scales. As the NiO thickness increased, the domain structure of unidirectional biased films formed smaller and more complex in-plane domains. By contrast, for the isotropically coupled films, large domains generally formed with increasing NiO thickness including a new cross type domain with out-of-plane magnetization orientation. The density of the cross domain is proportional to exchange biasing field, and the fact that the domain mainly originated from the strongest exchange coupled region was confirmed by imaging in an applied external field during a magnetization cycle.

Original languageEnglish
Pages (from-to)400-405
Number of pages6
JournalJournal of Magnetism and Magnetic Materials
Volume260
Issue number3
DOIs
Publication statusPublished - 2003 Apr
Externally publishedYes

Keywords

  • Cross-type domain
  • Exchange biasing
  • MFM
  • Nickel oxide

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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