Microstructural and optical analysis of superresolution phenomena due to Ge2Sb2Te5 thin films at blue light regime

Hyun Seok Lee, Taek Sung Lee, Yongwoon Lee, Jooho Kim, Suyoun Lee, Joo Youl Huh, Donghwan Kim, Byung Ki Cheong

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

Superresolution (SR) phenomena due to Ge2Sb2Te 5 films were examined by combined analysis of the transmission electron microscopy (TEM) microstructures of the laser-irradiated films and the results from dynamic and static tests using blue lasers. A new finding was made that comprises a complementary case of the classical SR readout by Ge 2Sb2Te5 film; an amorphous band instead of a closed aperture of melt in the crystalline background forms behind a moving laser but still produces a high SR signal. A complete carrier-to-noise-ratio curve of a SR-read-only memory employing Ge2Sb2Te 5 may be derived from a nonlinear optical effect, specifically thermally assisted saturable absorption.

Original languageEnglish
Article number221108
JournalApplied Physics Letters
Volume93
Issue number22
DOIs
Publication statusPublished - 2008 Dec 12

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thin films
carrier to noise ratios
lasers
static tests
dynamic tests
readout
apertures
transmission electron microscopy
microstructure
curves

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Microstructural and optical analysis of superresolution phenomena due to Ge2Sb2Te5 thin films at blue light regime. / Lee, Hyun Seok; Lee, Taek Sung; Lee, Yongwoon; Kim, Jooho; Lee, Suyoun; Huh, Joo Youl; Kim, Donghwan; Cheong, Byung Ki.

In: Applied Physics Letters, Vol. 93, No. 22, 221108, 12.12.2008.

Research output: Contribution to journalArticle

Lee, Hyun Seok ; Lee, Taek Sung ; Lee, Yongwoon ; Kim, Jooho ; Lee, Suyoun ; Huh, Joo Youl ; Kim, Donghwan ; Cheong, Byung Ki. / Microstructural and optical analysis of superresolution phenomena due to Ge2Sb2Te5 thin films at blue light regime. In: Applied Physics Letters. 2008 ; Vol. 93, No. 22.
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