Microstructural evolution and dielectric properties of Cu-deficient and Cu-excess CaCu3Ti4O12 ceramics

Kang Min Kim, Jong Heun Lee, Kyung Min Lee, Doh Yeon Kim, Doh Hyung Riu, Sung Bo Lee

Research output: Contribution to journalArticlepeer-review

43 Citations (Scopus)


The microstructural evolution and dielectric properties of CaCu3-xTi4O12-x (3 - x = 2.8-3.05) ceramics were investigated. Normal grain growth behavior was observed at Cu/Ca ≤ 2.9, while abnormal grain growth was observed at Cu/Ca ≥ 2.95. A CuO-rich intergranular liquid phase at Cu/Ca ≥ 2.95 and angular grain morphology were the main reasons for abnormal grain growth. However, the abundant intergranular liquid at Cu/Ca = 3.05 significantly affected the relative dielectric permittivity and dielectric loss. The CuO composition is the key parameter that determines the microstructure and dielectric properties of CCTO ceramics.

Original languageEnglish
Pages (from-to)284-291
Number of pages8
JournalMaterials Research Bulletin
Issue number2
Publication statusPublished - 2008 Feb 5


  • A. Electronic materials
  • A. Oxides
  • B. Dielectric properties

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering


Dive into the research topics of 'Microstructural evolution and dielectric properties of Cu-deficient and Cu-excess CaCu<sub>3</sub>Ti<sub>4</sub>O<sub>12</sub> ceramics'. Together they form a unique fingerprint.

Cite this