Mixup-based classification of mixed-type defect patterns in wafer bin maps

Wooksoo Shin, Hyungu Kahng, Seoung Bum Kim

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'Mixup-based classification of mixed-type defect patterns in wafer bin maps'. Together they form a unique fingerprint.

Engineering & Materials Science