TY - JOUR
T1 - Molecular beam epitaxial growth of In0.65Ga0.35 As quantum wells on GaAs substrates for 1.5 μm exciton resonance
AU - Kim, Sam Dong
AU - Lee, Heon
AU - Harris, J. S.
N1 - Funding Information:
computer simulation for designing QWs. Corn-ments and help from M. Visokay for TEM analysis is also gratefully acknowledged. This work was supported by ARPA and ONR through contract
PY - 1994/8/1
Y1 - 1994/8/1
N2 - A novel approach of growing high quality In0.65Ga0.35As multiple quantum wells (MQWs) with Al0.33Ga0.67As barriers on GaAs substrates by molecular beam epitaxy (MBE) is reported for optical devices operating near 1.5 μm at room temperature. Operation at 1.5 μm requires InGaAs QWs with very large lattice mismatch to the GaAs substrates (4.7% in this study). The best quality MQWs were achieved by adding one monolayer of GaAs smoothing layers with growth interruptions at the interfaces of both sides of the InGaAs wells and by growing at a very low temperature (280{ring operator}C) compared to the buffer layers and typical InGaAs layer growth temperatures (450{ring operator}C). The MQW region was grown on a linearly-graded InGaAs buffer layer with a 10% / μm grading rate which was fully relaxed, very smooth, and completely defect-free at the top region. This sample showed a sharp exciton peak near 1.5 μm at room temperature. Cross-section transmission electron microscopy (XTEM), four crystal X-ray diffractometry, and optical absorption measurement were used to characterize the MQW structures.
AB - A novel approach of growing high quality In0.65Ga0.35As multiple quantum wells (MQWs) with Al0.33Ga0.67As barriers on GaAs substrates by molecular beam epitaxy (MBE) is reported for optical devices operating near 1.5 μm at room temperature. Operation at 1.5 μm requires InGaAs QWs with very large lattice mismatch to the GaAs substrates (4.7% in this study). The best quality MQWs were achieved by adding one monolayer of GaAs smoothing layers with growth interruptions at the interfaces of both sides of the InGaAs wells and by growing at a very low temperature (280{ring operator}C) compared to the buffer layers and typical InGaAs layer growth temperatures (450{ring operator}C). The MQW region was grown on a linearly-graded InGaAs buffer layer with a 10% / μm grading rate which was fully relaxed, very smooth, and completely defect-free at the top region. This sample showed a sharp exciton peak near 1.5 μm at room temperature. Cross-section transmission electron microscopy (XTEM), four crystal X-ray diffractometry, and optical absorption measurement were used to characterize the MQW structures.
UR - http://www.scopus.com/inward/record.url?scp=0028485746&partnerID=8YFLogxK
U2 - 10.1016/0022-0248(94)90089-2
DO - 10.1016/0022-0248(94)90089-2
M3 - Article
AN - SCOPUS:0028485746
SN - 0022-0248
VL - 141
SP - 37
EP - 43
JO - Journal of Crystal Growth
JF - Journal of Crystal Growth
IS - 1-2
ER -