Molecular dynamics simulation of strain relaxation in Cu thin films on Ni(0 0 1)

Seong Jin Kim, Min Hyung Cho, Jang Hyuk Yoon, Ho Jang

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5 Citations (Scopus)


Atomistic details of an interfacial structure of Cu thin films on a Ni(0 0 1) substrate are investigated by molecular dynamics simulation using embedded atom method potentials. Results confirm the formation of stripes on the film surface with embedded {1 1 1} wedges, as reported by Müller et al., Phys Rev Lett 1996;76:2358, but suggest a different critical thickness (up to 11 Å) for appearance of the stripes.

Original languageEnglish
Pages (from-to)1105-1109
Number of pages5
JournalScripta Materialia
Issue number11
Publication statusPublished - 2005 Jun 1



  • Interfaces
  • Molecular dynamics
  • Strain relaxation
  • Thin films

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Materials Science(all)
  • Metals and Alloys

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