Abstract
We investigated the reasons why Ag reflectors in vertical light-emitting diodes showed much better morphological stability with the addition of an intermediate Ni layer by means of X-ray pole figures, scanning electron microscopy (SEM), and SEM electron backscatter diffraction (EBSD) techniques. The SEM results showed that, unlike the pitted Ag-only contacts, the Ni-combined Ag contacts annealed at 300 °C contained only hillocks, even after annealing for 60 min. The EBSD results demonstrated that the Ag-only samples were more strongly 〈1 1 1〉-textured than the Ni-combined Ag samples after annealing for 60 min. The pole-figure results also indicated that, for both the samples, the {1 1 1} texture was enhanced by annealing, although the Ag-only samples were more highly 〈1 1 1〉-textured than the Ni-combined Ag samples. On the basis of the SEM, EBSD, and pole-figure results, we interpret and discuss the possible mechanisms underlying the improved morphological stability of the Ni-combined Ag reflectors.
| Original language | English |
|---|---|
| Pages (from-to) | 342-349 |
| Number of pages | 8 |
| Journal | Superlattices and Microstructures |
| Volume | 73 |
| DOIs | |
| Publication status | Published - 2014 Jan 1 |
Fingerprint
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics
- Materials Science(all)
Cite this
Morphological stability of Ag reflector for high-power GaN-based vertical light-emitting diode by addition of Ni layer. / Choi, Young Yun; Seong, Tae Yeon.
In: Superlattices and Microstructures, Vol. 73, 01.01.2014, p. 342-349.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Morphological stability of Ag reflector for high-power GaN-based vertical light-emitting diode by addition of Ni layer
AU - Choi, Young Yun
AU - Seong, Tae Yeon
PY - 2014/1/1
Y1 - 2014/1/1
N2 - We investigated the reasons why Ag reflectors in vertical light-emitting diodes showed much better morphological stability with the addition of an intermediate Ni layer by means of X-ray pole figures, scanning electron microscopy (SEM), and SEM electron backscatter diffraction (EBSD) techniques. The SEM results showed that, unlike the pitted Ag-only contacts, the Ni-combined Ag contacts annealed at 300 °C contained only hillocks, even after annealing for 60 min. The EBSD results demonstrated that the Ag-only samples were more strongly 〈1 1 1〉-textured than the Ni-combined Ag samples after annealing for 60 min. The pole-figure results also indicated that, for both the samples, the {1 1 1} texture was enhanced by annealing, although the Ag-only samples were more highly 〈1 1 1〉-textured than the Ni-combined Ag samples. On the basis of the SEM, EBSD, and pole-figure results, we interpret and discuss the possible mechanisms underlying the improved morphological stability of the Ni-combined Ag reflectors.
AB - We investigated the reasons why Ag reflectors in vertical light-emitting diodes showed much better morphological stability with the addition of an intermediate Ni layer by means of X-ray pole figures, scanning electron microscopy (SEM), and SEM electron backscatter diffraction (EBSD) techniques. The SEM results showed that, unlike the pitted Ag-only contacts, the Ni-combined Ag contacts annealed at 300 °C contained only hillocks, even after annealing for 60 min. The EBSD results demonstrated that the Ag-only samples were more strongly 〈1 1 1〉-textured than the Ni-combined Ag samples after annealing for 60 min. The pole-figure results also indicated that, for both the samples, the {1 1 1} texture was enhanced by annealing, although the Ag-only samples were more highly 〈1 1 1〉-textured than the Ni-combined Ag samples. On the basis of the SEM, EBSD, and pole-figure results, we interpret and discuss the possible mechanisms underlying the improved morphological stability of the Ni-combined Ag reflectors.
KW - Ag reflector
KW - Electron backscatter diffraction
KW - LED
KW - X-ray pole figure
UR - http://www.scopus.com/inward/record.url?scp=84903943675&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84903943675&partnerID=8YFLogxK
U2 - 10.1016/j.spmi.2014.06.007
DO - 10.1016/j.spmi.2014.06.007
M3 - Article
AN - SCOPUS:84903943675
VL - 73
SP - 342
EP - 349
JO - Superlattices and Microstructures
JF - Superlattices and Microstructures
SN - 0749-6036
ER -