Morphology of poly(p-phenylenevinylene) thin films prepared directly on the surface of silicon wafers by the chemical vapor deposition polymerization

Kyungkon Kim, Mi Yoon Jung, Guo Lun Zhong, Jung Il Jin, Tae Young Kim, Dong June Ahn

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9 Citations (Scopus)

Abstract

The chemical vapor deposition polymerization (CVDP) of α, α′-dichloro-p-xylene on the (001) plane of silicon wafer surface followed by thermal dehydrochlorination produced PPV nanofilms in which the polymer chains are found to be in highly ordered morphology. The same CVDP polymerization of α,α′-dichloro-p-xylene on the quartz surface, however, produced disordered polymer chains. The morphology and chain orientations were studied by X-ray diffractometry and polarized UV-Vis absorption and polarizesd photoluminescence spectroscopies. The angle dependence of IR refractive absorption spectra of the PPV films also were studied.

Original languageEnglish
Pages (from-to)7-11
Number of pages5
JournalSynthetic Metals
Volume144
Issue number1
DOIs
Publication statusPublished - 2004 Jul 8

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Keywords

  • Chemical vapor deposition polymerization
  • CVD
  • IRRAS
  • Morphology
  • Polarized PL
  • Polarized UV-Vis absorption
  • PPV

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Polymers and Plastics

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