Nasolabial angle measuring system in lateral face image for bimaxillary protrusion judgment

Junheum Park, Seongjoon Park, Hwangnam Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Recently, in addition to orthodontic for correction of snaggletooth and malocclusion, orthodontic for enhancing facial aesthetics is also gaining interest. There is Nasolabial Angle as a criterion to judge the esthetics of the face. When the nasolabial angle is smaller than the standard, it is often judged as a bimaxillary protrusion. In this paper, we propose a system to calculate the nasolabial angle in facial lateral photography. Our system use edge detection and mapping coordination. Using gradient in the coordinate system, it finds three points that make up the nasolabial angle. Then, it calculates the angle by inner product.

Original languageEnglish
Title of host publicationInternational Conference on Information and Communication Technology Convergence
Subtitle of host publicationICT Convergence Technologies Leading the Fourth Industrial Revolution, ICTC 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages366-369
Number of pages4
Volume2017-December
ISBN (Electronic)9781509040315
DOIs
Publication statusPublished - 2017 Dec 12
Event8th International Conference on Information and Communication Technology Convergence, ICTC 2017 - Jeju Island, Korea, Republic of
Duration: 2017 Oct 182017 Oct 20

Other

Other8th International Conference on Information and Communication Technology Convergence, ICTC 2017
CountryKorea, Republic of
CityJeju Island
Period17/10/1817/10/20

Fingerprint

Photography
Edge detection
Byproducts
Measuring system

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Computer Science Applications
  • Information Systems
  • Information Systems and Management

Cite this

Park, J., Park, S., & Kim, H. (2017). Nasolabial angle measuring system in lateral face image for bimaxillary protrusion judgment. In International Conference on Information and Communication Technology Convergence: ICT Convergence Technologies Leading the Fourth Industrial Revolution, ICTC 2017 (Vol. 2017-December, pp. 366-369). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICTC.2017.8191004

Nasolabial angle measuring system in lateral face image for bimaxillary protrusion judgment. / Park, Junheum; Park, Seongjoon; Kim, Hwangnam.

International Conference on Information and Communication Technology Convergence: ICT Convergence Technologies Leading the Fourth Industrial Revolution, ICTC 2017. Vol. 2017-December Institute of Electrical and Electronics Engineers Inc., 2017. p. 366-369.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Park, J, Park, S & Kim, H 2017, Nasolabial angle measuring system in lateral face image for bimaxillary protrusion judgment. in International Conference on Information and Communication Technology Convergence: ICT Convergence Technologies Leading the Fourth Industrial Revolution, ICTC 2017. vol. 2017-December, Institute of Electrical and Electronics Engineers Inc., pp. 366-369, 8th International Conference on Information and Communication Technology Convergence, ICTC 2017, Jeju Island, Korea, Republic of, 17/10/18. https://doi.org/10.1109/ICTC.2017.8191004
Park J, Park S, Kim H. Nasolabial angle measuring system in lateral face image for bimaxillary protrusion judgment. In International Conference on Information and Communication Technology Convergence: ICT Convergence Technologies Leading the Fourth Industrial Revolution, ICTC 2017. Vol. 2017-December. Institute of Electrical and Electronics Engineers Inc. 2017. p. 366-369 https://doi.org/10.1109/ICTC.2017.8191004
Park, Junheum ; Park, Seongjoon ; Kim, Hwangnam. / Nasolabial angle measuring system in lateral face image for bimaxillary protrusion judgment. International Conference on Information and Communication Technology Convergence: ICT Convergence Technologies Leading the Fourth Industrial Revolution, ICTC 2017. Vol. 2017-December Institute of Electrical and Electronics Engineers Inc., 2017. pp. 366-369
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