Native and radiation induced defects in lattice mismatched InGaAs and InGaP

N. J. Ekins-Daukes, K. Arafune, H. S. Lee, T. Sasaki, M. Yamaguchi, A. Khan, T. Takamoto, T. Agui, K. Kamimura, M. Kaneiwa, M. Imaizumi, T. Ohshima, H. Itoh

Research output: Contribution to journalConference articlepeer-review

Fingerprint

Dive into the research topics of 'Native and radiation induced defects in lattice mismatched InGaAs and InGaP'. Together they form a unique fingerprint.

Engineering & Materials Science