Two-dimensional infrared scanning microscopy images of micro-structured surface patterns in an organic transistor device with metal electrode stripes on a polymer channel layer have been demonstrated. A compact single mode optical fiber scanning probe which has a micro dome-shape lens at the tip end was used for the scanning in which reflected beam intensities are coupled back to the optical fiber transceiver depending on the returned power of the sample material. Based on the experiment, the obtained structural dimensions of the micro structure specimen were well matched to the designed ones. These images were compared to the digital microscopy photos for a potential usage to conduct not only the in situ microscopic electrode pattern monitoring of the device but also to non-destructively investigate any surface reflecting material in micrometer scales.
ASJC Scopus subject areas
- Electrical and Electronic Engineering