Nitrogen-Induced Filament Confinement Technique for a Highly Reliable Hafnium-Based Electrochemical Metallization Threshold Switch and Its Application to Flexible Logic Circuits

Jae Hyeun Park, Seung Hwan Kim, Seung Geun Kim, Keun Heo, Hyun Yong Yu

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12 Citations (Scopus)

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Engineering & Materials Science

Chemical Compounds