Abstract
In this paper, we describe split-path domino (SP domino) logic which exhibits high-speed operation due to halved charge sharing problem. SP domino logic splits NMOS stacked transistors use for logic evaluation, in order to reduce charge sharing problem, which has become one of the critical noise problem in VDSM technology. Furthermore, SP domino logic needs no signal ordering, which simplifies logic synthesis. Our experimental results on several logic gates using 0.18um CMOS technology showed that proposed logic improves performance over textbook domino circuit up to 17% under the same noisy environment. Hence, SP domino logic is a good candidate for high-speed low-voltage operation in a very noisy environment.
| Original language | English |
|---|---|
| Title of host publication | 2003 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 277-280 |
| Number of pages | 4 |
| ISBN (Print) | 0780377494, 9780780377493 |
| DOIs | |
| Publication status | Published - 2003 |
| Event | IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003 - Tsimshatsui, Kowloon, Hong Kong Duration: 2003 Dec 16 → 2003 Dec 18 |
Other
| Other | IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003 |
|---|---|
| Country | Hong Kong |
| City | Tsimshatsui, Kowloon |
| Period | 03/12/16 → 03/12/18 |
Fingerprint
Keywords
- Charge sharing problem
- Deep submicron technology
- Domino logic
- Keeper size
- Noise
- Power X delay
- Split-path
ASJC Scopus subject areas
- Hardware and Architecture
- Electrical and Electronic Engineering
Cite this
Noise-aware domino logic design for deep submicron technology. / Yoon, Seok Soo; Yoon, Seok Ryong; Kim, Soo-Won; Kim, Chulwoo.
2003 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003. Institute of Electrical and Electronics Engineers Inc., 2003. p. 277-280 1283531.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Noise-aware domino logic design for deep submicron technology
AU - Yoon, Seok Soo
AU - Yoon, Seok Ryong
AU - Kim, Soo-Won
AU - Kim, Chulwoo
PY - 2003
Y1 - 2003
N2 - In this paper, we describe split-path domino (SP domino) logic which exhibits high-speed operation due to halved charge sharing problem. SP domino logic splits NMOS stacked transistors use for logic evaluation, in order to reduce charge sharing problem, which has become one of the critical noise problem in VDSM technology. Furthermore, SP domino logic needs no signal ordering, which simplifies logic synthesis. Our experimental results on several logic gates using 0.18um CMOS technology showed that proposed logic improves performance over textbook domino circuit up to 17% under the same noisy environment. Hence, SP domino logic is a good candidate for high-speed low-voltage operation in a very noisy environment.
AB - In this paper, we describe split-path domino (SP domino) logic which exhibits high-speed operation due to halved charge sharing problem. SP domino logic splits NMOS stacked transistors use for logic evaluation, in order to reduce charge sharing problem, which has become one of the critical noise problem in VDSM technology. Furthermore, SP domino logic needs no signal ordering, which simplifies logic synthesis. Our experimental results on several logic gates using 0.18um CMOS technology showed that proposed logic improves performance over textbook domino circuit up to 17% under the same noisy environment. Hence, SP domino logic is a good candidate for high-speed low-voltage operation in a very noisy environment.
KW - Charge sharing problem
KW - Deep submicron technology
KW - Domino logic
KW - Keeper size
KW - Noise
KW - Power X delay
KW - Split-path
UR - http://www.scopus.com/inward/record.url?scp=84946423248&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84946423248&partnerID=8YFLogxK
U2 - 10.1109/EDSSC.2003.1283531
DO - 10.1109/EDSSC.2003.1283531
M3 - Conference contribution
AN - SCOPUS:84946423248
SN - 0780377494
SN - 9780780377493
SP - 277
EP - 280
BT - 2003 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003
PB - Institute of Electrical and Electronics Engineers Inc.
ER -