Non-contact measurement of current distribution in parallel conductors by using hall sensors

Myungjin Park; Sangbeom Byun; Wooseok Kim; Jikwang Lee; Kyeongdal Choi; Haigun Lee

doi:10.1109/TASC.2008.922512

Non-contact measurement of current distribution in parallel conductors by using hall sensors

Myungjin Park, Sangbeom Byun, Wooseok Kim, Jikwang Lee, Kyeongdal Choi, Haigun Lee

Department of Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

8 Citations (Scopus)

Abstract

A parallel HTS conductor to flow large current is essential for applications of HTS power device. Non-uniform current distribution in the parallel conductor is caused mainly due to the difference of inductance. There are a contact method which measures current directly and a non-contact method which measure indirectly. But current distribution of each conductor in parallel conductors can not be measured with conventional method. In this paper, we researched a measurement method to identify current distribution of the parallel conductor indirectly with Hall sensors and compared with the analysis results by 2-D FEM.

Original language	English
Article number	4494477
Pages (from-to)	1135-1138
Number of pages	4
Journal	IEEE Transactions on Applied Superconductivity
Volume	18
Issue number	2
DOIs	https://doi.org/10.1109/TASC.2008.922512
Publication status	Published - 2008 Jun

Keywords

Current distribution
HTS
Hall sensor

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering

Access to Document

10.1109/TASC.2008.922512

Cite this

@article{b89a34c7d2c24331adbcc6441be7ad6f,

title = "Non-contact measurement of current distribution in parallel conductors by using hall sensors",

abstract = "A parallel HTS conductor to flow large current is essential for applications of HTS power device. Non-uniform current distribution in the parallel conductor is caused mainly due to the difference of inductance. There are a contact method which measures current directly and a non-contact method which measure indirectly. But current distribution of each conductor in parallel conductors can not be measured with conventional method. In this paper, we researched a measurement method to identify current distribution of the parallel conductor indirectly with Hall sensors and compared with the analysis results by 2-D FEM.",

keywords = "Current distribution, HTS, Hall sensor",

author = "Myungjin Park and Sangbeom Byun and Wooseok Kim and Jikwang Lee and Kyeongdal Choi and Haigun Lee",

note = "Funding Information: Manuscript received September 27, 2007. This work was supported by KESRI(R-2005-7-090), which is funded by MOCIE(Ministry of commerce, industry and energy). M. Park is with Korea Electrical Engineering & Science Research Institute (e-mail: pj1973@hanmail.net). S. Byun and K. Choi are with Korea Polytechnic University, Shiheung, Korea (e-mail: choidal@kpu.ac.kr). W. Kim is with Massachusetts Institute of Technology, Boston, USA (e-mail: wooseok@MIT.EDU). J. Lee is with Woosuk University, Wanju, Chunbuk, Korea (e-mail: jik-wang@woosuk.ac.kr). H. Lee is with Korea University, Seoul, Korea (e-mail: haigunlee@korea.ac. kr). Color versions of one or more of the figures in this paper are available online at http://ieeexplore.ieee.org. Digital Object Identifier 10.1109/TASC.2008.922512",

year = "2008",

month = jun,

doi = "10.1109/TASC.2008.922512",

language = "English",

volume = "18",

pages = "1135--1138",

journal = "IEEE Transactions on Applied Superconductivity",

issn = "1051-8223",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "2",

}

TY - JOUR

T1 - Non-contact measurement of current distribution in parallel conductors by using hall sensors

AU - Park, Myungjin

AU - Byun, Sangbeom

AU - Kim, Wooseok

AU - Lee, Jikwang

AU - Choi, Kyeongdal

AU - Lee, Haigun

N1 - Funding Information: Manuscript received September 27, 2007. This work was supported by KESRI(R-2005-7-090), which is funded by MOCIE(Ministry of commerce, industry and energy). M. Park is with Korea Electrical Engineering & Science Research Institute (e-mail: pj1973@hanmail.net). S. Byun and K. Choi are with Korea Polytechnic University, Shiheung, Korea (e-mail: choidal@kpu.ac.kr). W. Kim is with Massachusetts Institute of Technology, Boston, USA (e-mail: wooseok@MIT.EDU). J. Lee is with Woosuk University, Wanju, Chunbuk, Korea (e-mail: jik-wang@woosuk.ac.kr). H. Lee is with Korea University, Seoul, Korea (e-mail: haigunlee@korea.ac. kr). Color versions of one or more of the figures in this paper are available online at http://ieeexplore.ieee.org. Digital Object Identifier 10.1109/TASC.2008.922512

PY - 2008/6

Y1 - 2008/6

N2 - A parallel HTS conductor to flow large current is essential for applications of HTS power device. Non-uniform current distribution in the parallel conductor is caused mainly due to the difference of inductance. There are a contact method which measures current directly and a non-contact method which measure indirectly. But current distribution of each conductor in parallel conductors can not be measured with conventional method. In this paper, we researched a measurement method to identify current distribution of the parallel conductor indirectly with Hall sensors and compared with the analysis results by 2-D FEM.

AB - A parallel HTS conductor to flow large current is essential for applications of HTS power device. Non-uniform current distribution in the parallel conductor is caused mainly due to the difference of inductance. There are a contact method which measures current directly and a non-contact method which measure indirectly. But current distribution of each conductor in parallel conductors can not be measured with conventional method. In this paper, we researched a measurement method to identify current distribution of the parallel conductor indirectly with Hall sensors and compared with the analysis results by 2-D FEM.

KW - Current distribution

KW - HTS

KW - Hall sensor

UR - http://www.scopus.com/inward/record.url?scp=45149092352&partnerID=8YFLogxK

U2 - 10.1109/TASC.2008.922512

DO - 10.1109/TASC.2008.922512

M3 - Article

AN - SCOPUS:45149092352

VL - 18

SP - 1135

EP - 1138

JO - IEEE Transactions on Applied Superconductivity

JF - IEEE Transactions on Applied Superconductivity

SN - 1051-8223

IS - 2

M1 - 4494477

ER -

Non-contact measurement of current distribution in parallel conductors by using hall sensors

Abstract

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this