A series of sputtered Fe(30 Å)/Si(x) superlattices were grown for x = 10-40 A ̊. Magnetization and Kerr hysteresis loops, and neutron-reflectivity measurements identify antiferromagnetic (AF) coupling of the Fe layers at room temperature for x = 15 A ̊ nominal thickness, with switching fields of 6 kOe. X-ray structural analyses indicate that the spacer medium is crystalline for x < 20 Å while sputtered Si is amorphous (a). Failure to detect oscillations in the AF coupling for thicker Si layers is due to the formation of a-Si, as opposed to the crystalline silicide responsible for the coupling.
|Journal||Journal of Magnetism and Magnetic Materials|
|Publication status||Published - 1992 Dec|
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics