Abstract
A series of sputtered Fe(30 Å)/Si(x) superlattices were grown for x = 10-40 A ̊. Magnetization and Kerr hysteresis loops, and neutron-reflectivity measurements identify antiferromagnetic (AF) coupling of the Fe layers at room temperature for x = 15 A ̊ nominal thickness, with switching fields of 6 kOe. X-ray structural analyses indicate that the spacer medium is crystalline for x < 20 Å while sputtered Si is amorphous (a). Failure to detect oscillations in the AF coupling for thicker Si layers is due to the formation of a-Si, as opposed to the crystalline silicide responsible for the coupling.
Original language | English |
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Pages (from-to) | L301-L306 |
Journal | Journal of Magnetism and Magnetic Materials |
Volume | 117 |
Issue number | 3 |
DOIs | |
Publication status | Published - 1992 Dec |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics