Nonswitching van der Pauw technique using two different modulating frequencies

Gyu-Tae Kim, J. G. Park, Y. W. Park, C. Müller-Schwanneke, M. Wagenhals, S. Roth

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

We present a nonswitching van der Pauw technique using two independent ac current sources and two lock-in amplifiers. This technique may be useful to measure the resistance of delicate samples that might be easily damaged by electric shocks induced from switching, and can be extended to measure the anisotropy of resistance.

Original languageEnglish
Pages (from-to)2177-2178
Number of pages2
JournalReview of Scientific Instruments
Volume70
Issue number4
Publication statusPublished - 1999 Apr 1
Externally publishedYes

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Anisotropy
amplifiers
shock
anisotropy

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)
  • Instrumentation

Cite this

Kim, G-T., Park, J. G., Park, Y. W., Müller-Schwanneke, C., Wagenhals, M., & Roth, S. (1999). Nonswitching van der Pauw technique using two different modulating frequencies. Review of Scientific Instruments, 70(4), 2177-2178.

Nonswitching van der Pauw technique using two different modulating frequencies. / Kim, Gyu-Tae; Park, J. G.; Park, Y. W.; Müller-Schwanneke, C.; Wagenhals, M.; Roth, S.

In: Review of Scientific Instruments, Vol. 70, No. 4, 01.04.1999, p. 2177-2178.

Research output: Contribution to journalArticle

Kim, G-T, Park, JG, Park, YW, Müller-Schwanneke, C, Wagenhals, M & Roth, S 1999, 'Nonswitching van der Pauw technique using two different modulating frequencies', Review of Scientific Instruments, vol. 70, no. 4, pp. 2177-2178.
Kim G-T, Park JG, Park YW, Müller-Schwanneke C, Wagenhals M, Roth S. Nonswitching van der Pauw technique using two different modulating frequencies. Review of Scientific Instruments. 1999 Apr 1;70(4):2177-2178.
Kim, Gyu-Tae ; Park, J. G. ; Park, Y. W. ; Müller-Schwanneke, C. ; Wagenhals, M. ; Roth, S. / Nonswitching van der Pauw technique using two different modulating frequencies. In: Review of Scientific Instruments. 1999 ; Vol. 70, No. 4. pp. 2177-2178.
@article{20e3d1644a6e4db5b46ea0b2b1ce0252,
title = "Nonswitching van der Pauw technique using two different modulating frequencies",
abstract = "We present a nonswitching van der Pauw technique using two independent ac current sources and two lock-in amplifiers. This technique may be useful to measure the resistance of delicate samples that might be easily damaged by electric shocks induced from switching, and can be extended to measure the anisotropy of resistance.",
author = "Gyu-Tae Kim and Park, {J. G.} and Park, {Y. W.} and C. M{\"u}ller-Schwanneke and M. Wagenhals and S. Roth",
year = "1999",
month = "4",
day = "1",
language = "English",
volume = "70",
pages = "2177--2178",
journal = "Review of Scientific Instruments",
issn = "0034-6748",
publisher = "American Institute of Physics Publising LLC",
number = "4",

}

TY - JOUR

T1 - Nonswitching van der Pauw technique using two different modulating frequencies

AU - Kim, Gyu-Tae

AU - Park, J. G.

AU - Park, Y. W.

AU - Müller-Schwanneke, C.

AU - Wagenhals, M.

AU - Roth, S.

PY - 1999/4/1

Y1 - 1999/4/1

N2 - We present a nonswitching van der Pauw technique using two independent ac current sources and two lock-in amplifiers. This technique may be useful to measure the resistance of delicate samples that might be easily damaged by electric shocks induced from switching, and can be extended to measure the anisotropy of resistance.

AB - We present a nonswitching van der Pauw technique using two independent ac current sources and two lock-in amplifiers. This technique may be useful to measure the resistance of delicate samples that might be easily damaged by electric shocks induced from switching, and can be extended to measure the anisotropy of resistance.

UR - http://www.scopus.com/inward/record.url?scp=0013227749&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0013227749&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0013227749

VL - 70

SP - 2177

EP - 2178

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 4

ER -