Nonswitching van der Pauw technique using two different modulating frequencies

G. T. Kim; J. G. Park; Y. W. Park; C. Müller-Schwanneke; M. Wagenhals; S. Roth

doi:10.1063/1.1149738

Nonswitching van der Pauw technique using two different modulating frequencies

G. T. Kim, J. G. Park, Y. W. Park, C. Müller-Schwanneke, M. Wagenhals, S. Roth

Research output: Contribution to journal › Article › peer-review

11 Citations (Scopus)

Abstract

We present a nonswitching van der Pauw technique using two independent ac current sources and two lock-in amplifiers. This technique may be useful to measure the resistance of delicate samples that might be easily damaged by electric shocks induced from switching, and can be extended to measure the anisotropy of resistance.

Original language	English
Pages (from-to)	2177-2178
Number of pages	2
Journal	Review of Scientific Instruments
Volume	70
Issue number	4
DOIs	https://doi.org/10.1063/1.1149738
Publication status	Published - 1999 Apr
Externally published	Yes

ASJC Scopus subject areas

Instrumentation

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title = "Nonswitching van der Pauw technique using two different modulating frequencies",

abstract = "We present a nonswitching van der Pauw technique using two independent ac current sources and two lock-in amplifiers. This technique may be useful to measure the resistance of delicate samples that might be easily damaged by electric shocks induced from switching, and can be extended to measure the anisotropy of resistance.",

author = "Kim, {G. T.} and Park, {J. G.} and Park, {Y. W.} and C. M{\"u}ller-Schwanneke and M. Wagenhals and S. Roth",

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AU - Müller-Schwanneke, C.

AU - Wagenhals, M.

AU - Roth, S.

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AB - We present a nonswitching van der Pauw technique using two independent ac current sources and two lock-in amplifiers. This technique may be useful to measure the resistance of delicate samples that might be easily damaged by electric shocks induced from switching, and can be extended to measure the anisotropy of resistance.

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