Observation of the transverse second-harmonic magneto-optic Kerr effect from Ni81Fe19 thin film structures

T. M. Crawford; C. T. Rogers; T. J. Silva; Young-geun Kim

Observation of the transverse second-harmonic magneto-optic Kerr effect from Ni₈₁Fe₁₉ thin film structures

T. M. Crawford, C. T. Rogers, T. J. Silva, Young-geun Kim

Research output: Contribution to journal › Article

Abstract

We report second-harmonic magneto-optic Kerr measurements on air-exposed, polycrystalline Ni₈₁Fe₁₉ thin films, ranging in thickness from 1 nm to 2 μm, on Al₂O₃ coated Si (001). For samples thicker than 20 nm, in the transverse Kerr geometry, we observe a factor of 4 change in second-harmonic intensity upon magnetization reversal. For thin samples, we observe interference between second-harmonic fields from the various interfaces and deterioration of ferromagnetism in the 1 and 2 nm films. Modeling suggests that the Ni₈₁Fe₁₉/Al₂O ₃ interface has a larger second-order susceptibility than the air/Ni₈₁Fe₁₉ surface.

Original language	English
Journal	Applied Physics Letters
Publication status	Published - 1995 Dec 1
Externally published	Yes

Fingerprint

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

Cite this

Crawford, T. M., Rogers, C. T., Silva, T. J., & Kim, Y. (1995). Observation of the transverse second-harmonic magneto-optic Kerr effect from Ni₈₁Fe₁₉ thin film structures. Applied Physics Letters.

@article{831507accfb44026895d159d2b741458,

title = "Observation of the transverse second-harmonic magneto-optic Kerr effect from Ni81Fe19 thin film structures",

abstract = "We report second-harmonic magneto-optic Kerr measurements on air-exposed, polycrystalline Ni81Fe19 thin films, ranging in thickness from 1 nm to 2 μm, on Al2O3 coated Si (001). For samples thicker than 20 nm, in the transverse Kerr geometry, we observe a factor of 4 change in second-harmonic intensity upon magnetization reversal. For thin samples, we observe interference between second-harmonic fields from the various interfaces and deterioration of ferromagnetism in the 1 and 2 nm films. Modeling suggests that the Ni81Fe19/Al2O 3 interface has a larger second-order susceptibility than the air/Ni81Fe19 surface.",

author = "Crawford, {T. M.} and Rogers, {C. T.} and Silva, {T. J.} and Young-geun Kim",

year = "1995",

month = "12",

day = "1",

language = "English",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

}

TY - JOUR

T1 - Observation of the transverse second-harmonic magneto-optic Kerr effect from Ni81Fe19 thin film structures

AU - Crawford, T. M.

AU - Rogers, C. T.

AU - Silva, T. J.

AU - Kim, Young-geun

PY - 1995/12/1

Y1 - 1995/12/1

N2 - We report second-harmonic magneto-optic Kerr measurements on air-exposed, polycrystalline Ni81Fe19 thin films, ranging in thickness from 1 nm to 2 μm, on Al2O3 coated Si (001). For samples thicker than 20 nm, in the transverse Kerr geometry, we observe a factor of 4 change in second-harmonic intensity upon magnetization reversal. For thin samples, we observe interference between second-harmonic fields from the various interfaces and deterioration of ferromagnetism in the 1 and 2 nm films. Modeling suggests that the Ni81Fe19/Al2O 3 interface has a larger second-order susceptibility than the air/Ni81Fe19 surface.

AB - We report second-harmonic magneto-optic Kerr measurements on air-exposed, polycrystalline Ni81Fe19 thin films, ranging in thickness from 1 nm to 2 μm, on Al2O3 coated Si (001). For samples thicker than 20 nm, in the transverse Kerr geometry, we observe a factor of 4 change in second-harmonic intensity upon magnetization reversal. For thin samples, we observe interference between second-harmonic fields from the various interfaces and deterioration of ferromagnetism in the 1 and 2 nm films. Modeling suggests that the Ni81Fe19/Al2O 3 interface has a larger second-order susceptibility than the air/Ni81Fe19 surface.

UR - http://www.scopus.com/inward/record.url?scp=36448998567&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=36448998567&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:36448998567

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951