Abstract
We report second-harmonic magneto-optic Kerr measurements on air-exposed, polycrystalline Ni81Fe19 thin films, ranging in thickness from 1 nm to 2 μm, on Al2O3 coated Si (001). For samples thicker than 20 nm, in the transverse Kerr geometry, we observe a factor of 4 change in second-harmonic intensity upon magnetization reversal. For thin samples, we observe interference between second-harmonic fields from the various interfaces and deterioration of ferromagnetism in the 1 and 2 nm films. Modeling suggests that the Ni81Fe19/Al2O 3 interface has a larger second-order susceptibility than the air/Ni81Fe19 surface.
| Original language | English |
|---|---|
| Journal | Applied Physics Letters |
| Publication status | Published - 1995 Dec 1 |
| Externally published | Yes |
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ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)
Cite this
Observation of the transverse second-harmonic magneto-optic Kerr effect from Ni81Fe19 thin film structures. / Crawford, T. M.; Rogers, C. T.; Silva, T. J.; Kim, Young-geun.
In: Applied Physics Letters, 01.12.1995.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Observation of the transverse second-harmonic magneto-optic Kerr effect from Ni81Fe19 thin film structures
AU - Crawford, T. M.
AU - Rogers, C. T.
AU - Silva, T. J.
AU - Kim, Young-geun
PY - 1995/12/1
Y1 - 1995/12/1
N2 - We report second-harmonic magneto-optic Kerr measurements on air-exposed, polycrystalline Ni81Fe19 thin films, ranging in thickness from 1 nm to 2 μm, on Al2O3 coated Si (001). For samples thicker than 20 nm, in the transverse Kerr geometry, we observe a factor of 4 change in second-harmonic intensity upon magnetization reversal. For thin samples, we observe interference between second-harmonic fields from the various interfaces and deterioration of ferromagnetism in the 1 and 2 nm films. Modeling suggests that the Ni81Fe19/Al2O 3 interface has a larger second-order susceptibility than the air/Ni81Fe19 surface.
AB - We report second-harmonic magneto-optic Kerr measurements on air-exposed, polycrystalline Ni81Fe19 thin films, ranging in thickness from 1 nm to 2 μm, on Al2O3 coated Si (001). For samples thicker than 20 nm, in the transverse Kerr geometry, we observe a factor of 4 change in second-harmonic intensity upon magnetization reversal. For thin samples, we observe interference between second-harmonic fields from the various interfaces and deterioration of ferromagnetism in the 1 and 2 nm films. Modeling suggests that the Ni81Fe19/Al2O 3 interface has a larger second-order susceptibility than the air/Ni81Fe19 surface.
UR - http://www.scopus.com/inward/record.url?scp=36448998567&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=36448998567&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:36448998567
JO - Applied Physics Letters
JF - Applied Physics Letters
SN - 0003-6951
ER -