On the scaling limits of low-frequency noise in SiGe HBTs

J. Johansen, Z. Jin, J. D. Cressler, Y. Cui, G. Niu, Q. Liang, J. S. Rieh, G. Freeman, D. Ahlgren, A. Joseph

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

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Engineering & Materials Science