Optical study of Mn-doped Bi 4Ti 3O 12 thin films by spectroscopic ellipsometry

Soon Yong Hwang, Tae Jung Kim, Jae Jin Yoon, Young Hun Cha, Young Dong Kim, Tae Geun Seong, Lee Seung Kang, Sahn Nahm

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

Mn-doped Bi 4Ti 3O 12(B 4T 3) thin films grown at 400 °C on a Pt/Ti/SiO2/Si substrate through pulsed laser deposition (PLD) were analyzed via spectroscopic ellipsometry (SE). The PLD targets were produced through the conventional solid-state sintering method, and the film samples were annealed at 600 °C. The SE spectra of B 4T 3 films were measured using a rotating analyzer type ellipsometer within the 1.12 to 6.52 eV energy range, with the various incidence angles. The optical properties of the B 4T 3 films with increasing Mn-mol concentration were extracted using a multilayer model for the whole structure and the Tauc-Lorentz (TL) dispersion relation for the B 4T 3 film layer. The analysis results clearly showed that the significant changes in optical properties of B 4T 3 films are caused by thermal annealing procedure and the Mn-mol concentrations. X-ray diffraction (XRD) measurement was also performed to confirm the results of SE analysis.

Original languageEnglish
Pages (from-to)884-888
Number of pages5
JournalJournal of Nanoscience and Nanotechnology
Volume11
Issue number1
DOIs
Publication statusPublished - 2011 Jan

Keywords

  • Bi Ti O
  • Ellipsometry
  • Mn-doped
  • Tauc-Lorentz dispersion relation

ASJC Scopus subject areas

  • Bioengineering
  • Chemistry(all)
  • Biomedical Engineering
  • Materials Science(all)
  • Condensed Matter Physics

Fingerprint Dive into the research topics of 'Optical study of Mn-doped Bi <sub>4</sub>Ti <sub>3</sub>O <sub>12</sub> thin films by spectroscopic ellipsometry'. Together they form a unique fingerprint.

  • Cite this

    Hwang, S. Y., Kim, T. J., Yoon, J. J., Cha, Y. H., Kim, Y. D., Seong, T. G., Kang, L. S., & Nahm, S. (2011). Optical study of Mn-doped Bi 4Ti 3O 12 thin films by spectroscopic ellipsometry. Journal of Nanoscience and Nanotechnology, 11(1), 884-888. https://doi.org/10.1166/jnn.2011.3261