Optical study of ZnSexTe1 - X alloys using spectroscopic ellipsometry

Hosun Lee, S. M. Kim, B. Y. Seo, E. Z. Seong, S. H. Choi, S. Lee, J. K. Furdyna

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

We report pseudodielectric function data 〈∈〉 = 〈∈1〉 + i〈∈2〉 of ZnSexTe1 - x samples grown on GaAs substrates. The data were obtained from 1.5 to 6.5 eV using spectroscopic ellipsometry. Critical-point parameters were obtained by fitting model line shapes to numerically calculated second-energy derivatives of 〈∈〉. The bowing parameters of E0, E1, and E1 + Δ1 were determined and were comparable to that of E0 quoted from the literature. We observed a monotonie increase of the linewidth of the E1 gap up to x = 0.85, whereas that of E1 + Δ1 showed a maximum value near x = 0.5. We attribute this anomalous broadening of the E1 gap to sample microstructures developed in the low-Te composition alloys.

Original languageEnglish
Pages (from-to)2997-2999
Number of pages3
JournalApplied Physics Letters
Volume77
Issue number19
DOIs
Publication statusPublished - 2000 Nov 6
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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