Optical study of ZnSexTe1 - X alloys using spectroscopic ellipsometry

Hosun Lee, S. M. Kim, B. Y. Seo, E. Z. Seong, S. H. Choi, S. Lee, J. K. Furdyna

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Abstract

We report pseudodielectric function data 〈∈〉 = 〈∈1〉 + i〈∈2〉 of ZnSexTe1 - x samples grown on GaAs substrates. The data were obtained from 1.5 to 6.5 eV using spectroscopic ellipsometry. Critical-point parameters were obtained by fitting model line shapes to numerically calculated second-energy derivatives of 〈∈〉. The bowing parameters of E0, E1, and E1 + Δ1 were determined and were comparable to that of E0 quoted from the literature. We observed a monotonie increase of the linewidth of the E1 gap up to x = 0.85, whereas that of E1 + Δ1 showed a maximum value near x = 0.5. We attribute this anomalous broadening of the E1 gap to sample microstructures developed in the low-Te composition alloys.

Original languageEnglish
Pages (from-to)2997-2999
Number of pages3
JournalApplied Physics Letters
Volume77
Issue number19
DOIs
Publication statusPublished - 2000 Nov 6

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ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Lee, H., Kim, S. M., Seo, B. Y., Seong, E. Z., Choi, S. H., Lee, S., & Furdyna, J. K. (2000). Optical study of ZnSexTe1 - X alloys using spectroscopic ellipsometry. Applied Physics Letters, 77(19), 2997-2999. https://doi.org/10.1063/1.1323999