Optimization of structured illumination microscopy with designing and rotating a grid pattern using a spatial light modulator

Jeong Heon Han, Nak Won Yoo, Ji Hoon Kang, Byeong Kwon Ju, Min Chul Park

Research output: Contribution to journalArticle


Our structured illumination microscopy (SIM) is based on a spatial light modulator (SLM) instead of an illumination mask, which does not need to be attached to a linear stage. This SIM can easily design the period of the one-dimensional grid related to the optical sectioning strength and can rapidly acquire three-dimensional data. The optimization of SIM with an SLM is proposed. Previous studies primarily varied magnification with a high numerical aperture objective to optimize the axial response. It is feasible to obtain the maximum optical sectioning strength by designing a grid pattern that has an appropriately high spatial frequency and to uniformly cover the entire frequency spectrum of the sample by rotating a grid pattern. We have successfully optimized SIM with such a grid and covered the frequency spectrum by rotating a grid pattern in multiple orientations.

Original languageEnglish
Article number094102
JournalOptical Engineering
Issue number9
Publication statusPublished - 2019 Sep 1



  • optical sectioning
  • optimization
  • spatial light modulator
  • structured illumination microscopy
  • three-dimensional measurement

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Engineering(all)

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