Abstract
Our structured illumination microscopy (SIM) is based on a spatial light modulator (SLM) instead of an illumination mask, which does not need to be attached to a linear stage. This SIM can easily design the period of the one-dimensional grid related to the optical sectioning strength and can rapidly acquire three-dimensional data. The optimization of SIM with an SLM is proposed. Previous studies primarily varied magnification with a high numerical aperture objective to optimize the axial response. It is feasible to obtain the maximum optical sectioning strength by designing a grid pattern that has an appropriately high spatial frequency and to uniformly cover the entire frequency spectrum of the sample by rotating a grid pattern. We have successfully optimized SIM with such a grid and covered the frequency spectrum by rotating a grid pattern in multiple orientations.
| Original language | English |
|---|---|
| Article number | 094102 |
| Journal | Optical Engineering |
| Volume | 58 |
| Issue number | 9 |
| DOIs | |
| Publication status | Published - 2019 Sep 1 |
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Keywords
- optical sectioning
- optimization
- spatial light modulator
- structured illumination microscopy
- three-dimensional measurement
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Engineering(all)
Cite this
Optimization of structured illumination microscopy with designing and rotating a grid pattern using a spatial light modulator. / Han, Jeong Heon; Yoo, Nak Won; Kang, Ji Hoon; Ju, Byeong Kwon; Park, Min Chul.
In: Optical Engineering, Vol. 58, No. 9, 094102, 01.09.2019.Research output: Contribution to journal › Article
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TY - JOUR
T1 - Optimization of structured illumination microscopy with designing and rotating a grid pattern using a spatial light modulator
AU - Han, Jeong Heon
AU - Yoo, Nak Won
AU - Kang, Ji Hoon
AU - Ju, Byeong Kwon
AU - Park, Min Chul
PY - 2019/9/1
Y1 - 2019/9/1
N2 - Our structured illumination microscopy (SIM) is based on a spatial light modulator (SLM) instead of an illumination mask, which does not need to be attached to a linear stage. This SIM can easily design the period of the one-dimensional grid related to the optical sectioning strength and can rapidly acquire three-dimensional data. The optimization of SIM with an SLM is proposed. Previous studies primarily varied magnification with a high numerical aperture objective to optimize the axial response. It is feasible to obtain the maximum optical sectioning strength by designing a grid pattern that has an appropriately high spatial frequency and to uniformly cover the entire frequency spectrum of the sample by rotating a grid pattern. We have successfully optimized SIM with such a grid and covered the frequency spectrum by rotating a grid pattern in multiple orientations.
AB - Our structured illumination microscopy (SIM) is based on a spatial light modulator (SLM) instead of an illumination mask, which does not need to be attached to a linear stage. This SIM can easily design the period of the one-dimensional grid related to the optical sectioning strength and can rapidly acquire three-dimensional data. The optimization of SIM with an SLM is proposed. Previous studies primarily varied magnification with a high numerical aperture objective to optimize the axial response. It is feasible to obtain the maximum optical sectioning strength by designing a grid pattern that has an appropriately high spatial frequency and to uniformly cover the entire frequency spectrum of the sample by rotating a grid pattern. We have successfully optimized SIM with such a grid and covered the frequency spectrum by rotating a grid pattern in multiple orientations.
KW - optical sectioning
KW - optimization
KW - spatial light modulator
KW - structured illumination microscopy
KW - three-dimensional measurement
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UR - http://www.scopus.com/inward/citedby.url?scp=85072402245&partnerID=8YFLogxK
U2 - 10.1117/1.OE.58.9.094102
DO - 10.1117/1.OE.58.9.094102
M3 - Article
AN - SCOPUS:85072402245
VL - 58
JO - Optical Engineering
JF - Optical Engineering
SN - 0091-3286
IS - 9
M1 - 094102
ER -