Abstract
Our structured illumination microscopy (SIM) is based on a spatial light modulator (SLM) instead of an illumination mask, which does not need to be attached to a linear stage. This SIM can easily design the period of the one-dimensional grid related to the optical sectioning strength and can rapidly acquire three-dimensional data. The optimization of SIM with an SLM is proposed. Previous studies primarily varied magnification with a high numerical aperture objective to optimize the axial response. It is feasible to obtain the maximum optical sectioning strength by designing a grid pattern that has an appropriately high spatial frequency and to uniformly cover the entire frequency spectrum of the sample by rotating a grid pattern. We have successfully optimized SIM with such a grid and covered the frequency spectrum by rotating a grid pattern in multiple orientations.
Original language | English |
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Article number | 094102 |
Journal | Optical Engineering |
Volume | 58 |
Issue number | 9 |
DOIs | |
Publication status | Published - 2019 Sep 1 |
Keywords
- optical sectioning
- optimization
- spatial light modulator
- structured illumination microscopy
- three-dimensional measurement
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Engineering(all)