Origin of PL intensity increase of CaMgSi2O6:Eu 2+ phosphor after baking process for PDPs application

W. B. Im, J. H. Kang, D. C. Lee, S. Lee, D. Y. Jeon, Yun Chan Kang, K. Y. Jung

Research output: Contribution to journalArticle

62 Citations (Scopus)

Abstract

We have synthesized blue-emitting CaMgSi2O6:Eu 2+ (CMS) and evaluated its thermal stability after baking process. To evaluate its thermal stability, CMS was baked in air at 500 and 600°C for 20 min, respectively, and compared with BaMgAl10O 17:Eu2+ (BAM) treated in the same condition. After baking process, CMS showed somewhat increased photoluminescence (PL) intensity with baking temperature. To investigate the reasons behind the increase of PL intensity after baking process, vacuum ultraviolet (VUV)/PL, electron spin resonance (ESR), X-ray photoelectron spectroscopy (XPS) techniques were applied. From the ESR and the XPS analyses, it is noted that spectral intensity of Eu2+ ion somewhat increased. It was believed that due to charge balance Eu3+ ions reduced to Eu2+ ions during the baking process in air. It is clear that the concentration of Eu2+ increased after the baking process in air and it leads to slight increase of the VUV/PL intensity of CMS phosphor.

Original languageEnglish
Pages (from-to)197-201
Number of pages5
JournalSolid State Communications
Volume133
Issue number3
DOIs
Publication statusPublished - 2005 Jan 1
Externally publishedYes

Fingerprint

baking
Phosphors
phosphors
Photoluminescence
photoluminescence
Ions
Paramagnetic resonance
Thermodynamic stability
X ray photoelectron spectroscopy
Air
Vacuum
air
electron paramagnetic resonance
thermal stability
photoelectron spectroscopy
vacuum
ions
x rays
Temperature

Keywords

  • A. CaMgSiO:Eu
  • A. Phosphor
  • D. Optical properties
  • E. Luminescence

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Materials Chemistry

Cite this

Origin of PL intensity increase of CaMgSi2O6:Eu 2+ phosphor after baking process for PDPs application. / Im, W. B.; Kang, J. H.; Lee, D. C.; Lee, S.; Jeon, D. Y.; Kang, Yun Chan; Jung, K. Y.

In: Solid State Communications, Vol. 133, No. 3, 01.01.2005, p. 197-201.

Research output: Contribution to journalArticle

Im, W. B. ; Kang, J. H. ; Lee, D. C. ; Lee, S. ; Jeon, D. Y. ; Kang, Yun Chan ; Jung, K. Y. / Origin of PL intensity increase of CaMgSi2O6:Eu 2+ phosphor after baking process for PDPs application. In: Solid State Communications. 2005 ; Vol. 133, No. 3. pp. 197-201.
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AU - Jeon, D. Y.

AU - Kang, Yun Chan

AU - Jung, K. Y.

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N2 - We have synthesized blue-emitting CaMgSi2O6:Eu 2+ (CMS) and evaluated its thermal stability after baking process. To evaluate its thermal stability, CMS was baked in air at 500 and 600°C for 20 min, respectively, and compared with BaMgAl10O 17:Eu2+ (BAM) treated in the same condition. After baking process, CMS showed somewhat increased photoluminescence (PL) intensity with baking temperature. To investigate the reasons behind the increase of PL intensity after baking process, vacuum ultraviolet (VUV)/PL, electron spin resonance (ESR), X-ray photoelectron spectroscopy (XPS) techniques were applied. From the ESR and the XPS analyses, it is noted that spectral intensity of Eu2+ ion somewhat increased. It was believed that due to charge balance Eu3+ ions reduced to Eu2+ ions during the baking process in air. It is clear that the concentration of Eu2+ increased after the baking process in air and it leads to slight increase of the VUV/PL intensity of CMS phosphor.

AB - We have synthesized blue-emitting CaMgSi2O6:Eu 2+ (CMS) and evaluated its thermal stability after baking process. To evaluate its thermal stability, CMS was baked in air at 500 and 600°C for 20 min, respectively, and compared with BaMgAl10O 17:Eu2+ (BAM) treated in the same condition. After baking process, CMS showed somewhat increased photoluminescence (PL) intensity with baking temperature. To investigate the reasons behind the increase of PL intensity after baking process, vacuum ultraviolet (VUV)/PL, electron spin resonance (ESR), X-ray photoelectron spectroscopy (XPS) techniques were applied. From the ESR and the XPS analyses, it is noted that spectral intensity of Eu2+ ion somewhat increased. It was believed that due to charge balance Eu3+ ions reduced to Eu2+ ions during the baking process in air. It is clear that the concentration of Eu2+ increased after the baking process in air and it leads to slight increase of the VUV/PL intensity of CMS phosphor.

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