Patch-based over-exposure correction in image

Yeo Jin Yoon, Dae Hong Lee, Seok Jae Kang, Won Jae Park, Sung-Jea Ko

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Most of conventional over-exposure correction methods fail to reconstruct the detail information of the overexposed region (OER) in an image. This paper presents a novel method which can effectively reconstruct the texture as well as the luminance and the color of the OER without user interaction. The proposed method is performed based on a patch-based region filling method. In a patch including the over-exposed pixels, new luminance values are progressively estimated according to the luminance variation in the reference patch (RP) which is selected in the well-exposed region. For the color correction of the OER, the color values of the RP are simply copied. Once the OER is completely filled, the resultant image is refined using the Gaussian-based filters. Experimental results demonstrate that the proposed method provides more preferable results than conventional one.

Original languageEnglish
Title of host publicationProceedings of the International Symposium on Consumer Electronics, ISCE
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781479945924
DOIs
Publication statusPublished - 2014 Jan 1
Event18th IEEE International Symposium on Consumer Electronics, ISCE 2014 - Jeju, Korea, Republic of
Duration: 2014 Jun 222014 Jun 25

Other

Other18th IEEE International Symposium on Consumer Electronics, ISCE 2014
CountryKorea, Republic of
CityJeju
Period14/6/2214/6/25

Fingerprint

Luminance
Color
Textures
Pixels

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Yoon, Y. J., Lee, D. H., Kang, S. J., Park, W. J., & Ko, S-J. (2014). Patch-based over-exposure correction in image. In Proceedings of the International Symposium on Consumer Electronics, ISCE [6884423] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISCE.2014.6884423

Patch-based over-exposure correction in image. / Yoon, Yeo Jin; Lee, Dae Hong; Kang, Seok Jae; Park, Won Jae; Ko, Sung-Jea.

Proceedings of the International Symposium on Consumer Electronics, ISCE. Institute of Electrical and Electronics Engineers Inc., 2014. 6884423.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Yoon, YJ, Lee, DH, Kang, SJ, Park, WJ & Ko, S-J 2014, Patch-based over-exposure correction in image. in Proceedings of the International Symposium on Consumer Electronics, ISCE., 6884423, Institute of Electrical and Electronics Engineers Inc., 18th IEEE International Symposium on Consumer Electronics, ISCE 2014, Jeju, Korea, Republic of, 14/6/22. https://doi.org/10.1109/ISCE.2014.6884423
Yoon YJ, Lee DH, Kang SJ, Park WJ, Ko S-J. Patch-based over-exposure correction in image. In Proceedings of the International Symposium on Consumer Electronics, ISCE. Institute of Electrical and Electronics Engineers Inc. 2014. 6884423 https://doi.org/10.1109/ISCE.2014.6884423
Yoon, Yeo Jin ; Lee, Dae Hong ; Kang, Seok Jae ; Park, Won Jae ; Ko, Sung-Jea. / Patch-based over-exposure correction in image. Proceedings of the International Symposium on Consumer Electronics, ISCE. Institute of Electrical and Electronics Engineers Inc., 2014.
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