Perfect anti-reflection from first principles

Kyoung Ho Kim, Q Han Park

Research output: Contribution to journalArticle

39 Citations (Scopus)

Abstract

Reducing unwanted reflections through impedance matching, called anti-reflection, has long been an important challenge in optics and electrical engineering. Beyond trial and error optimization, however, a systematic way to realize anti-reflection is still absent. Here, we report the discovery of an analytic solution to this long standing problem. For electromagnetic waves, we find the graded permittivity and permeability that completely remove any given impedance mismatch. We demonstrate that perfect broadband anti-reflection is possible when a dispersive, graded refractive index medium is used for the impedance-matching layer. We also present a design rule for the ultra-thin anti-reflection coating which we confirm experimentally by showing the anti-reflection behavior of an exemplary λ/25-thick coating made of metamaterials. This work opens a new path to anti-reflection applications in optoelectronic device, transmission line and stealth technologies.

Original languageEnglish
Article number1062
JournalScientific Reports
Volume3
DOIs
Publication statusPublished - 2013 Jan 28

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Electric Impedance
Electromagnetic Radiation
Refractometry
Permeability
Technology
Equipment and Supplies

ASJC Scopus subject areas

  • General

Cite this

Perfect anti-reflection from first principles. / Kim, Kyoung Ho; Park, Q Han.

In: Scientific Reports, Vol. 3, 1062, 28.01.2013.

Research output: Contribution to journalArticle

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