Abstract
We have performed an exhaustive study of the phase diagram of Y-Ba-Cu-O thin films using chemical analysis, energy dispersive x-ray spectroscopy, Auger electron spectroscopy, and x-ray diffraction. We show that Raman scattering can provide information regarding impurity phases and oxygen stoichiometry in thin films.
Original language | English |
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Pages (from-to) | 808-810 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 53 |
Issue number | 9 |
DOIs | |
Publication status | Published - 1988 |
Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)