Phase diagram and oxygen stoichiometry of Y-Ba-Cu-O thin films

K. Y. Yang; H. Homma; Seong Rae Lee; R. Bhadra; M. Grimsditch; S. D. Bader; J. P. Locquet; Y. Bruynseraede; Ivan K. Schuller

doi:10.1063/1.100149

Phase diagram and oxygen stoichiometry of Y-Ba-Cu-O thin films

K. Y. Yang, H. Homma, Seong Rae Lee, R. Bhadra, M. Grimsditch, S. D. Bader, J. P. Locquet, Y. Bruynseraede, Ivan K. Schuller

Research output: Contribution to journal › Article

15 Citations (Scopus)

Abstract

We have performed an exhaustive study of the phase diagram of Y-Ba-Cu-O thin films using chemical analysis, energy dispersive x-ray spectroscopy, Auger electron spectroscopy, and x-ray diffraction. We show that Raman scattering can provide information regarding impurity phases and oxygen stoichiometry in thin films.

Original language	English
Pages (from-to)	808-810
Number of pages	3
Journal	Applied Physics Letters
Volume	53
Issue number	9
DOIs	https://doi.org/10.1063/1.100149
Publication status	Published - 1988
Externally published	Yes

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ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

Cite this

Yang, K. Y., Homma, H., Lee, S. R., Bhadra, R., Grimsditch, M., Bader, S. D., Locquet, J. P., Bruynseraede, Y., & Schuller, I. K. (1988). Phase diagram and oxygen stoichiometry of Y-Ba-Cu-O thin films. Applied Physics Letters, 53(9), 808-810. https://doi.org/10.1063/1.100149

@article{51de381932734563bda590571fcdd06c,

title = "Phase diagram and oxygen stoichiometry of Y-Ba-Cu-O thin films",

abstract = "We have performed an exhaustive study of the phase diagram of Y-Ba-Cu-O thin films using chemical analysis, energy dispersive x-ray spectroscopy, Auger electron spectroscopy, and x-ray diffraction. We show that Raman scattering can provide information regarding impurity phases and oxygen stoichiometry in thin films.",

author = "Yang, {K. Y.} and H. Homma and Lee, {Seong Rae} and R. Bhadra and M. Grimsditch and Bader, {S. D.} and Locquet, {J. P.} and Y. Bruynseraede and Schuller, {Ivan K.}",

year = "1988",

doi = "10.1063/1.100149",

language = "English",

volume = "53",

pages = "808--810",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "9",

}

TY - JOUR

T1 - Phase diagram and oxygen stoichiometry of Y-Ba-Cu-O thin films

AU - Yang, K. Y.

AU - Homma, H.

AU - Lee, Seong Rae

AU - Bhadra, R.

AU - Grimsditch, M.

AU - Bader, S. D.

AU - Locquet, J. P.

AU - Bruynseraede, Y.

AU - Schuller, Ivan K.

PY - 1988

Y1 - 1988

N2 - We have performed an exhaustive study of the phase diagram of Y-Ba-Cu-O thin films using chemical analysis, energy dispersive x-ray spectroscopy, Auger electron spectroscopy, and x-ray diffraction. We show that Raman scattering can provide information regarding impurity phases and oxygen stoichiometry in thin films.

AB - We have performed an exhaustive study of the phase diagram of Y-Ba-Cu-O thin films using chemical analysis, energy dispersive x-ray spectroscopy, Auger electron spectroscopy, and x-ray diffraction. We show that Raman scattering can provide information regarding impurity phases and oxygen stoichiometry in thin films.

UR - http://www.scopus.com/inward/record.url?scp=33748739803&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33748739803&partnerID=8YFLogxK

U2 - 10.1063/1.100149

DO - 10.1063/1.100149

M3 - Article

AN - SCOPUS:33748739803

VL - 53

SP - 808

EP - 810

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 9

ER -

Access to Document

10.1063/1.100149