Phase field modelling of stressed grain growth: Analytical study and the effect of microstructural length scale

M. Jamshidian, T. Rabczuk

Research output: Contribution to journalArticle

20 Citations (Scopus)

Abstract

We establish the correlation between the diffuse interface and sharp interface descriptions for stressed grain boundary migration by presenting analytical solutions for stressed migration of a circular grain boundary in a bicrystalline phase field domain. The validity and accuracy of the phase field model is investigated by comparing the phase field simulation results against analytical solutions. The phase field model can reproduce precise boundary kinetics and stress evolution provided that a thermodynamically consistent theory and proper expressions for model parameters in terms of physical material properties are employed. Quantitative phase field simulations are then employed to investigate the effect of microstructural length scale on microstructure and texture evolution by stressed grain growth in an elastically deformed polycrystalline aggregate. The simulation results reveal a transitional behaviour from normal to abnormal grain growth by increasing the microstructural length scale.

Original languageEnglish
Pages (from-to)23-35
Number of pages13
JournalJournal of Computational Physics
Volume261
DOIs
Publication statusPublished - 2014 Mar 15

Keywords

  • Analytical method
  • Microstructural length scale
  • Phase field modelling
  • Polycrystalline microstructure
  • Stressed grain growth

ASJC Scopus subject areas

  • Numerical Analysis
  • Modelling and Simulation
  • Physics and Astronomy (miscellaneous)
  • Physics and Astronomy(all)
  • Computer Science Applications
  • Computational Mathematics
  • Applied Mathematics

Fingerprint Dive into the research topics of 'Phase field modelling of stressed grain growth: Analytical study and the effect of microstructural length scale'. Together they form a unique fingerprint.

  • Cite this