Phase identification of cobalt ferrite/metal composite thin films using convergent beam electron diffraction

J. G. Na, C. H. Park, N. H. Heo, S. R. Lee, J. Kim, K. Park

Research output: Contribution to journalArticle

Abstract

Cobalt ferrite/metal composite thin films with a saturation magnetization (Ms) of ∼0.729 Weber m-2 were prepared by a reactive sputtering method. The Ms of the thin films increased with increasing substrate temperature. The microstructures of the thin films were identified by a convergent beam electron diffraction method. For the thin films deposited at high substrate temperatures (> 300 °C), CoxFe1-x (x ≈ 0.62) metal alloys were separated from the cobalt ferrite matrix. A cobalt ferrite phase was determined as CoFe2O4 with a cubic structure (a0=0.839 nm) and a space group of Fd3m, while a metal phase CoxFe1-x (x ≈ 0.62) with a b.c.c. structure (a 0=0.289 nm) and a space group of Im3m.

Original languageEnglish
Pages (from-to)323-326
Number of pages4
JournalJournal of Materials Science: Materials in Electronics
Volume9
Issue number5
DOIs
Publication statusPublished - 1998 Oct

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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