Phase identification of cobalt ferrite/metal composite thin films using convergent beam electron diffraction

J. G. Na, C. H. Park, N. H. Heo, Seong Rae Lee, J. Kim, K. Park

Research output: Contribution to journalArticle

Abstract

Cobalt ferrite/metal composite thin films with a saturation magnetization (Ms) of approximately 0.729 Weber m-2 were prepared by a reactive sputtering method. The Ms of the thin films increased with increasing substrate temperature. The microstructures of the thin films were identified by a convergent beam electron diffraction method. For the thin films deposited at high substrate temperatures (>300 °C), CoxFe1-x(x≈0.62) metal alloys were separated from the cobalt ferrite matrix. A cobalt ferrite phase was determined as CoFe2O4 with a cubic structure (a0 = 0.839 nm) and a space group of Fd3m, while a metal phase CoxFe1-x(x≈0.62) with a b.c.c, structure (a0 = 0.289 nm) and a space group of Im3m.

Original languageEnglish
Pages (from-to)323-326
Number of pages4
JournalJournal of Materials Science: Materials in Electronics
Volume9
Issue number5
DOIs
Publication statusPublished - 1998 Oct 1

Fingerprint

Composite films
Electron diffraction
Ferrite
ferrites
Cobalt
cobalt
electron diffraction
Metals
Thin films
composite materials
thin films
metals
Reactive sputtering
Substrates
Saturation magnetization
sputtering
saturation
Temperature
magnetization
microstructure

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Materials Science(all)
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Phase identification of cobalt ferrite/metal composite thin films using convergent beam electron diffraction. / Na, J. G.; Park, C. H.; Heo, N. H.; Lee, Seong Rae; Kim, J.; Park, K.

In: Journal of Materials Science: Materials in Electronics, Vol. 9, No. 5, 01.10.1998, p. 323-326.

Research output: Contribution to journalArticle

@article{407df07bee6a4814a9965f64edd13699,
title = "Phase identification of cobalt ferrite/metal composite thin films using convergent beam electron diffraction",
abstract = "Cobalt ferrite/metal composite thin films with a saturation magnetization (Ms) of approximately 0.729 Weber m-2 were prepared by a reactive sputtering method. The Ms of the thin films increased with increasing substrate temperature. The microstructures of the thin films were identified by a convergent beam electron diffraction method. For the thin films deposited at high substrate temperatures (>300 °C), CoxFe1-x(x≈0.62) metal alloys were separated from the cobalt ferrite matrix. A cobalt ferrite phase was determined as CoFe2O4 with a cubic structure (a0 = 0.839 nm) and a space group of Fd3m, while a metal phase CoxFe1-x(x≈0.62) with a b.c.c, structure (a0 = 0.289 nm) and a space group of Im3m.",
author = "Na, {J. G.} and Park, {C. H.} and Heo, {N. H.} and Lee, {Seong Rae} and J. Kim and K. Park",
year = "1998",
month = "10",
day = "1",
doi = "10.1023/A:1008998800655",
language = "English",
volume = "9",
pages = "323--326",
journal = "Journal of Materials Science: Materials in Electronics",
issn = "0957-4522",
publisher = "Springer New York",
number = "5",

}

TY - JOUR

T1 - Phase identification of cobalt ferrite/metal composite thin films using convergent beam electron diffraction

AU - Na, J. G.

AU - Park, C. H.

AU - Heo, N. H.

AU - Lee, Seong Rae

AU - Kim, J.

AU - Park, K.

PY - 1998/10/1

Y1 - 1998/10/1

N2 - Cobalt ferrite/metal composite thin films with a saturation magnetization (Ms) of approximately 0.729 Weber m-2 were prepared by a reactive sputtering method. The Ms of the thin films increased with increasing substrate temperature. The microstructures of the thin films were identified by a convergent beam electron diffraction method. For the thin films deposited at high substrate temperatures (>300 °C), CoxFe1-x(x≈0.62) metal alloys were separated from the cobalt ferrite matrix. A cobalt ferrite phase was determined as CoFe2O4 with a cubic structure (a0 = 0.839 nm) and a space group of Fd3m, while a metal phase CoxFe1-x(x≈0.62) with a b.c.c, structure (a0 = 0.289 nm) and a space group of Im3m.

AB - Cobalt ferrite/metal composite thin films with a saturation magnetization (Ms) of approximately 0.729 Weber m-2 were prepared by a reactive sputtering method. The Ms of the thin films increased with increasing substrate temperature. The microstructures of the thin films were identified by a convergent beam electron diffraction method. For the thin films deposited at high substrate temperatures (>300 °C), CoxFe1-x(x≈0.62) metal alloys were separated from the cobalt ferrite matrix. A cobalt ferrite phase was determined as CoFe2O4 with a cubic structure (a0 = 0.839 nm) and a space group of Fd3m, while a metal phase CoxFe1-x(x≈0.62) with a b.c.c, structure (a0 = 0.289 nm) and a space group of Im3m.

UR - http://www.scopus.com/inward/record.url?scp=0032182806&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0032182806&partnerID=8YFLogxK

U2 - 10.1023/A:1008998800655

DO - 10.1023/A:1008998800655

M3 - Article

AN - SCOPUS:0032182806

VL - 9

SP - 323

EP - 326

JO - Journal of Materials Science: Materials in Electronics

JF - Journal of Materials Science: Materials in Electronics

SN - 0957-4522

IS - 5

ER -