@inproceedings{326bb7c2fc9644db8d19505830414aad,
title = "Photoconductive probing and computer simulation of microwave potentials inside a SiGe MMIC",
abstract = "Electrical potentials inside a SiGe MMIC are measured at frequencies up to 20 GHz using a micro-machined photoconductive sampling probe and compared with values predicted using microwave CAD software. The results illustrate that this combination of simulation and in-circuit measurement technique is a powerful tool for performing diagnostics of the microwave performance of Si-based RF circuits. The methodology can be used for applications such as fault isolation and validation of device models, as well as for investigation of the sensitivity of performance to process variations.",
author = "G. David and K. Yang and M. Crites and Rieh, {J. S.} and Lu, {L. H.} and P. Bhattacharya and Katehi, {L. P.B.} and Whitaker, {J. F.}",
note = "Funding Information: This work has been funded by the MUM project on “Power Combining Systems” under contract: DAAG 55-97-0132, by the Air Force Ofice of Scientific Research, Air Force Materiel Command, USAF, under grant no. F496.20-98-I-0365, and by the NSF Center for Ultrafast Optical Science under STC PHY 8920108. G. David was supported by a Feodor-Lynen Fellowship of the Alexander von Humboldt-Foundation, Germany Publisher Copyright: {\textcopyright} 1998 IEEE.; 1st Topical Meeting on Silicon Mono1ithic Integrated Circuits in RF Systems, SiRF 1998 ; Conference date: 18-09-1998 Through 18-09-1998",
year = "1998",
doi = "10.1109/SMIC.1998.750219",
language = "English",
series = "1998 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, SiRF 1998",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "187--191",
editor = "Sammy Kayali",
booktitle = "1998 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, SiRF 1998",
}