TY - GEN
T1 - Photoconductive probing and computer simulation of microwave potentials inside a SiGe MMIC
AU - David, G.
AU - Yang, K.
AU - Crites, M.
AU - Rieh, J. S.
AU - Lu, L. H.
AU - Bhattacharya, P.
AU - Katehi, L. P.B.
AU - Whitaker, J. F.
N1 - Funding Information:
This work has been funded by the MUM project on “Power Combining Systems” under contract: DAAG 55-97-0132, by the Air Force Ofice of Scientific Research, Air Force Materiel Command, USAF, under grant no. F496.20-98-I-0365, and by the NSF Center for Ultrafast Optical Science under STC PHY 8920108. G. David was supported by a Feodor-Lynen Fellowship of the Alexander von Humboldt-Foundation, Germany
PY - 1998
Y1 - 1998
N2 - Electrical potentials inside a SiGe MMIC are measured at frequencies up to 20 GHz using a micro-machined photoconductive sampling probe and compared with values predicted using microwave CAD software. The results illustrate that this combination of simulation and in-circuit measurement technique is a powerful tool for performing diagnostics of the microwave performance of Si-based RF circuits. The methodology can be used for applications such as fault isolation and validation of device models, as well as for investigation of the sensitivity of performance to process variations.
AB - Electrical potentials inside a SiGe MMIC are measured at frequencies up to 20 GHz using a micro-machined photoconductive sampling probe and compared with values predicted using microwave CAD software. The results illustrate that this combination of simulation and in-circuit measurement technique is a powerful tool for performing diagnostics of the microwave performance of Si-based RF circuits. The methodology can be used for applications such as fault isolation and validation of device models, as well as for investigation of the sensitivity of performance to process variations.
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U2 - 10.1109/SMIC.1998.750219
DO - 10.1109/SMIC.1998.750219
M3 - Conference contribution
AN - SCOPUS:84884210404
T3 - 1998 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, SiRF 1998
SP - 187
EP - 191
BT - 1998 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, SiRF 1998
A2 - Kayali, Sammy
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 1st Topical Meeting on Silicon Mono1ithic Integrated Circuits in RF Systems, SiRF 1998
Y2 - 18 September 1998 through 18 September 1998
ER -