The photoelectromagnetic effects on electron and proton irradiated CuInSe2 (CIS) thin films were investigated by using radio frequency sputtering method. The damage constant was estimated from the change in diffusion length before and after irradiation. It was found that the diffusion length decreased due to irradiation-induced defects when the electron fluence exceeded 1×1016cm-2.
ASJC Scopus subject areas
- Physics and Astronomy(all)