Physical and microstructural properties of NiO- and Ni-YSZ composite thin films fabricated by pulsed-laser deposition at T≤700°C

Ho Sung Noh, Jong Sung Park, Ji Won Son, Heon Lee, Jong Ho Lee, Hae Weon Lee

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39 Citations (Scopus)

Abstract

The physical and microstructural properties of NiO- and Ni-YSZ composite thin films deposited by pulsed-laser deposition have been investigated for nanoporous anode electrodes of SOFC applications. An NiO-YSZ thin film which was deposited at room temperature and postannealed at 700°C exhibited a fine porous structure, but electrical conduction was not detected when reduced. On the other hand, 700°C-deposited NiO-YSZ films showed appropriate crystallinity and exhibited electrical conductivity after reduction; however, massive Ni agglomeration occurred and porous structures were not obtained as intended. It was shown that as the Ni content and the reduction temperature increase, the coarsening becomes much more severe.

Original languageEnglish
Pages (from-to)3059-3064
Number of pages6
JournalJournal of the American Ceramic Society
Volume92
Issue number12
DOIs
Publication statusPublished - 2009 Dec 1

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ASJC Scopus subject areas

  • Ceramics and Composites
  • Materials Chemistry

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