Piezoelectric properties of highly oriented lead-free Na 0.5K 0.5NbO 3 films as determined using piezoelectric force microscopy

J. S. Kim, I. R. Hwang, S. H. Hong, J. H. Lee, B. H. Park, Ahn Cheol Woo, Sahn Nahm

Research output: Contribution to journalArticle

21 Citations (Scopus)

Abstract

We have deposited highly oriented Na 0.5K 0.5NbO 3 (NKN) films on LaMnO 3/LaAlO 3 (001) substrates by using pulsed laser deposition with a stoichiometric ceramic target. X-ray diffraction (XRD) analysis and electron probe microanalyzer (EPMA) show c-axis-oriented growth of stoichiometric NKN films. In order to investigate the local piezoelectric properties of our NKN films, we have measured the piezoelectric constant (das) values for the NKN films by using a piezoelectric force microscope modified using an atomic force microscope and a lock-in amplifier. We have confirmed that the piezoelectric constant of ∼40 pm/V for our highly oriented NKN film grown on a LaMnO 3/LaAlO 3 substrate is comparable to that of an epitaxially grown PbZr 0.3Ti 0.7O 3 film grown on the same structure.

Original languageEnglish
Pages (from-to)1583-1587
Number of pages5
JournalJournal of the Korean Physical Society
Volume48
Issue number6
Publication statusPublished - 2006 Jun 1

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microscopy
microscopes
electron probes
pulsed laser deposition
amplifiers
ceramics
probes
diffraction
x rays

Keywords

  • Lead-free piezoelectric material
  • NKN
  • PFM
  • Piezoelectric constant
  • PLD

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Piezoelectric properties of highly oriented lead-free Na 0.5K 0.5NbO 3 films as determined using piezoelectric force microscopy. / Kim, J. S.; Hwang, I. R.; Hong, S. H.; Lee, J. H.; Park, B. H.; Woo, Ahn Cheol; Nahm, Sahn.

In: Journal of the Korean Physical Society, Vol. 48, No. 6, 01.06.2006, p. 1583-1587.

Research output: Contribution to journalArticle

Kim, J. S. ; Hwang, I. R. ; Hong, S. H. ; Lee, J. H. ; Park, B. H. ; Woo, Ahn Cheol ; Nahm, Sahn. / Piezoelectric properties of highly oriented lead-free Na 0.5K 0.5NbO 3 films as determined using piezoelectric force microscopy. In: Journal of the Korean Physical Society. 2006 ; Vol. 48, No. 6. pp. 1583-1587.
@article{60c1b6244dcb47da9c321c06ae1bf38e,
title = "Piezoelectric properties of highly oriented lead-free Na 0.5K 0.5NbO 3 films as determined using piezoelectric force microscopy",
abstract = "We have deposited highly oriented Na 0.5K 0.5NbO 3 (NKN) films on LaMnO 3/LaAlO 3 (001) substrates by using pulsed laser deposition with a stoichiometric ceramic target. X-ray diffraction (XRD) analysis and electron probe microanalyzer (EPMA) show c-axis-oriented growth of stoichiometric NKN films. In order to investigate the local piezoelectric properties of our NKN films, we have measured the piezoelectric constant (das) values for the NKN films by using a piezoelectric force microscope modified using an atomic force microscope and a lock-in amplifier. We have confirmed that the piezoelectric constant of ∼40 pm/V for our highly oriented NKN film grown on a LaMnO 3/LaAlO 3 substrate is comparable to that of an epitaxially grown PbZr 0.3Ti 0.7O 3 film grown on the same structure.",
keywords = "Lead-free piezoelectric material, NKN, PFM, Piezoelectric constant, PLD",
author = "Kim, {J. S.} and Hwang, {I. R.} and Hong, {S. H.} and Lee, {J. H.} and Park, {B. H.} and Woo, {Ahn Cheol} and Sahn Nahm",
year = "2006",
month = "6",
day = "1",
language = "English",
volume = "48",
pages = "1583--1587",
journal = "Journal of the Korean Physical Society",
issn = "0374-4884",
publisher = "Korean Physical Society",
number = "6",

}

TY - JOUR

T1 - Piezoelectric properties of highly oriented lead-free Na 0.5K 0.5NbO 3 films as determined using piezoelectric force microscopy

AU - Kim, J. S.

AU - Hwang, I. R.

AU - Hong, S. H.

AU - Lee, J. H.

AU - Park, B. H.

AU - Woo, Ahn Cheol

AU - Nahm, Sahn

PY - 2006/6/1

Y1 - 2006/6/1

N2 - We have deposited highly oriented Na 0.5K 0.5NbO 3 (NKN) films on LaMnO 3/LaAlO 3 (001) substrates by using pulsed laser deposition with a stoichiometric ceramic target. X-ray diffraction (XRD) analysis and electron probe microanalyzer (EPMA) show c-axis-oriented growth of stoichiometric NKN films. In order to investigate the local piezoelectric properties of our NKN films, we have measured the piezoelectric constant (das) values for the NKN films by using a piezoelectric force microscope modified using an atomic force microscope and a lock-in amplifier. We have confirmed that the piezoelectric constant of ∼40 pm/V for our highly oriented NKN film grown on a LaMnO 3/LaAlO 3 substrate is comparable to that of an epitaxially grown PbZr 0.3Ti 0.7O 3 film grown on the same structure.

AB - We have deposited highly oriented Na 0.5K 0.5NbO 3 (NKN) films on LaMnO 3/LaAlO 3 (001) substrates by using pulsed laser deposition with a stoichiometric ceramic target. X-ray diffraction (XRD) analysis and electron probe microanalyzer (EPMA) show c-axis-oriented growth of stoichiometric NKN films. In order to investigate the local piezoelectric properties of our NKN films, we have measured the piezoelectric constant (das) values for the NKN films by using a piezoelectric force microscope modified using an atomic force microscope and a lock-in amplifier. We have confirmed that the piezoelectric constant of ∼40 pm/V for our highly oriented NKN film grown on a LaMnO 3/LaAlO 3 substrate is comparable to that of an epitaxially grown PbZr 0.3Ti 0.7O 3 film grown on the same structure.

KW - Lead-free piezoelectric material

KW - NKN

KW - PFM

KW - Piezoelectric constant

KW - PLD

UR - http://www.scopus.com/inward/record.url?scp=33746085986&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33746085986&partnerID=8YFLogxK

M3 - Article

VL - 48

SP - 1583

EP - 1587

JO - Journal of the Korean Physical Society

JF - Journal of the Korean Physical Society

SN - 0374-4884

IS - 6

ER -