Piezoelectric properties of highly oriented lead-free Na 0.5K 0.5NbO 3 films as determined using piezoelectric force microscopy

J. S. Kim, I. R. Hwang, S. H. Hong, J. H. Lee, B. H. Park, Ahn Cheol Woo, Nahm Sahn

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21 Citations (Scopus)


We have deposited highly oriented Na 0.5K 0.5NbO 3 (NKN) films on LaMnO 3/LaAlO 3 (001) substrates by using pulsed laser deposition with a stoichiometric ceramic target. X-ray diffraction (XRD) analysis and electron probe microanalyzer (EPMA) show c-axis-oriented growth of stoichiometric NKN films. In order to investigate the local piezoelectric properties of our NKN films, we have measured the piezoelectric constant (das) values for the NKN films by using a piezoelectric force microscope modified using an atomic force microscope and a lock-in amplifier. We have confirmed that the piezoelectric constant of ∼40 pm/V for our highly oriented NKN film grown on a LaMnO 3/LaAlO 3 substrate is comparable to that of an epitaxially grown PbZr 0.3Ti 0.7O 3 film grown on the same structure.

Original languageEnglish
Pages (from-to)1583-1587
Number of pages5
JournalJournal of the Korean Physical Society
Issue number6
Publication statusPublished - 2006 Jun


  • Lead-free piezoelectric material
  • NKN
  • PFM
  • PLD
  • Piezoelectric constant

ASJC Scopus subject areas

  • Physics and Astronomy(all)


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