Piezoelectric properties of highly oriented lead-free Na 0.5K 0.5NbO 3 films as determined using piezoelectric force microscopy

J. S. Kim, I. R. Hwang, S. H. Hong, J. H. Lee, B. H. Park, Ahn Cheol Woo, Nahm Sahn

Research output: Contribution to journalArticlepeer-review

23 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Piezoelectric properties of highly oriented lead-free Na 0.5K 0.5NbO 3 films as determined using piezoelectric force microscopy'. Together they form a unique fingerprint.

Physics & Astronomy