Possibility of transport through a single acceptor in a gate-all-around silicon nanowire PMOSFET

Byoung Hak Hong, Young Chai Jung, Jae Sung Rieh, Sung Woo Hwang, Keun Hwi Cho, K. H. Yeo, S. D. Suk, Y. Y. Yeoh, M. Li, Dong Won Kim, Donggun Park, Kyung Seok Oh, Won Seong Lee

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)

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Engineering & Materials Science