Possible degradation mechanism in ZnS:Mn alternating current thin-film electroluminescent display

Yun Hi Lee, In Jae Chung, Myung Hwan Oh

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

To study origins of alternating current thin-film electroluminescent display (AC-TFELD) degradation phenomena, we have fabricated two different types of AC-TFELD with multilayered insulators. For an accelerated aging, high-frequency voltages were applied and brightness versus operating time characteristics were measured. Surface morphology (SEM), Auger electron spectroscopy (AES) in-depth profiles, and AES spectra were examined for the aged devices with and without Si3N4 interlayers. From the obtained results, we proposed that the formation of zinc-oxy-sulfides in ZnS:Mn-insulator at the ITO side may play a significant role in the aging phenomena and degradation of brightness (B)-operating time (T) characteristics for our devices. Therefore, we suggest that the dielectric interlayer of stable stochiometry must be inserted in ZnS:Mn-insulator at the In2O 3-SnO2(ITO) side to improve the aging characteristics.

Original languageEnglish
Pages (from-to)962-964
Number of pages3
JournalApplied Physics Letters
Volume58
Issue number9
DOIs
Publication statusPublished - 1991

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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