TY - JOUR
T1 - Practical approach to power integrity-driven design process for power-delivery networks
AU - Ko, Baekseok
AU - Kim, Joowon
AU - Ryoo, Jaemin
AU - Hwang, Chulsoon
AU - Kwon, Chan Keun
AU - Kim, Soo-Won
PY - 2016/9/1
Y1 - 2016/9/1
N2 - The authors present a practical design process that considers the power noise problem in CPU blocks for application processors used in smart TVs. The target impedance is determined by modelling the RLC circuit of a system-on-chip power net. The target impedance of a power delivery network is then determined by applying the extracted chip current profile for finalising the design budget. The authors modelled the on-chip power net by combining vector network analyser measurements with an on-chip model for power integrity analysis. The authors demonstrated the optimisation and design strategy by using a ball grid array ball interconnection and case studies on the placement of multilayer ceramic capacitors. The simulation results showed good agreement with the measurement results. The error in the minimum value (negative direction) by voltage droop was less than 8.6%, while the difference in voltage noise ripple was 2.69% for a criterion of 1.1 V assuming a worst-case condition of 1.2 V.
AB - The authors present a practical design process that considers the power noise problem in CPU blocks for application processors used in smart TVs. The target impedance is determined by modelling the RLC circuit of a system-on-chip power net. The target impedance of a power delivery network is then determined by applying the extracted chip current profile for finalising the design budget. The authors modelled the on-chip power net by combining vector network analyser measurements with an on-chip model for power integrity analysis. The authors demonstrated the optimisation and design strategy by using a ball grid array ball interconnection and case studies on the placement of multilayer ceramic capacitors. The simulation results showed good agreement with the measurement results. The error in the minimum value (negative direction) by voltage droop was less than 8.6%, while the difference in voltage noise ripple was 2.69% for a criterion of 1.1 V assuming a worst-case condition of 1.2 V.
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U2 - 10.1049/iet-cds.2015.0285
DO - 10.1049/iet-cds.2015.0285
M3 - Article
AN - SCOPUS:84988446651
SN - 1751-858X
VL - 10
SP - 448
EP - 455
JO - IET Circuits, Devices and Systems
JF - IET Circuits, Devices and Systems
IS - 5
ER -