Abstract
By using a prism coupler technique in conjunction with reflectivity measurements, we have obtained highly accurate relations for the dispersion of the indices of refraction n for a series of MBE-grown Cd1-xZnxTe alloys. Initially, the prism coupler technique was used to determine n at discrete wavelengths with an accuracy of at least 0.1%, and also to concurrently determine the epilayer thicknesses with an uncertainty of less than 0.5%. Having obtained precise values for both n (at discrete wavelengths) and the thicknesses of the Cd1-xZnxTe epilayers, we were then able to correctly decipher the values for n at the maxima and minima of the reflectivity spectra observed on the above epilayers, and thereby generate a continuous variation of the indices of refraction as a function of wavelength. Fitting the dispersion of n in each alloy to a Sellmeier-type dispersion relation, we have obtained the dependence of the constants appearing in this relation on the alloy concentration. This enables one to predict n not only as a function of wavelength, but also as a function of alloy composition.
| Original language | English |
|---|---|
| Pages (from-to) | 798-803 |
| Number of pages | 6 |
| Journal | Journal of Electronic Materials |
| Volume | 29 |
| Issue number | 6 |
| Publication status | Published - 2000 Jun 1 |
| Externally published | Yes |
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ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Materials Science(all)
- Electronic, Optical and Magnetic Materials
- Physics and Astronomy (miscellaneous)
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Precise measurements of the dispersion of the index of refraction for Cd1-xZnxTe alloys. / Peiris, F. C.; Lee, Sang Hoon; Bindley, U.; Furdyna, J. K.
In: Journal of Electronic Materials, Vol. 29, No. 6, 01.06.2000, p. 798-803.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Precise measurements of the dispersion of the index of refraction for Cd1-xZnxTe alloys
AU - Peiris, F. C.
AU - Lee, Sang Hoon
AU - Bindley, U.
AU - Furdyna, J. K.
PY - 2000/6/1
Y1 - 2000/6/1
N2 - By using a prism coupler technique in conjunction with reflectivity measurements, we have obtained highly accurate relations for the dispersion of the indices of refraction n for a series of MBE-grown Cd1-xZnxTe alloys. Initially, the prism coupler technique was used to determine n at discrete wavelengths with an accuracy of at least 0.1%, and also to concurrently determine the epilayer thicknesses with an uncertainty of less than 0.5%. Having obtained precise values for both n (at discrete wavelengths) and the thicknesses of the Cd1-xZnxTe epilayers, we were then able to correctly decipher the values for n at the maxima and minima of the reflectivity spectra observed on the above epilayers, and thereby generate a continuous variation of the indices of refraction as a function of wavelength. Fitting the dispersion of n in each alloy to a Sellmeier-type dispersion relation, we have obtained the dependence of the constants appearing in this relation on the alloy concentration. This enables one to predict n not only as a function of wavelength, but also as a function of alloy composition.
AB - By using a prism coupler technique in conjunction with reflectivity measurements, we have obtained highly accurate relations for the dispersion of the indices of refraction n for a series of MBE-grown Cd1-xZnxTe alloys. Initially, the prism coupler technique was used to determine n at discrete wavelengths with an accuracy of at least 0.1%, and also to concurrently determine the epilayer thicknesses with an uncertainty of less than 0.5%. Having obtained precise values for both n (at discrete wavelengths) and the thicknesses of the Cd1-xZnxTe epilayers, we were then able to correctly decipher the values for n at the maxima and minima of the reflectivity spectra observed on the above epilayers, and thereby generate a continuous variation of the indices of refraction as a function of wavelength. Fitting the dispersion of n in each alloy to a Sellmeier-type dispersion relation, we have obtained the dependence of the constants appearing in this relation on the alloy concentration. This enables one to predict n not only as a function of wavelength, but also as a function of alloy composition.
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M3 - Article
VL - 29
SP - 798
EP - 803
JO - Journal of Electronic Materials
JF - Journal of Electronic Materials
SN - 0361-5235
IS - 6
ER -