### Abstract

By using a prism coupler technique in conjunction with reflectivity measurements, we have obtained highly accurate relations for the dispersion of the indices of refraction n for a series of MBE-grown Cd_{1-x}Zn_{x}Te alloys. Initially, the prism coupler technique was used to determine n at discrete wavelengths with an accuracy of at least 0.1%, and also to concurrently determine the epilayer thicknesses with an uncertainty of less than 0.5%. Having obtained precise values for both n (at discrete wavelengths) and the thicknesses of the Cd_{1-x}Zn_{x}Te epilayers, we were then able to correctly decipher the values for n at the maxima and minima of the reflectivity spectra observed on the above epilayers, and thereby generate a continuous variation of the indices of refraction as a function of wavelength. Fitting the dispersion of n in each alloy to a Sellmeier-type dispersion relation, we have obtained the dependence of the constants appearing in this relation on the alloy concentration. This enables one to predict n not only as a function of wavelength, but also as a function of alloy composition.

Original language | English |
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Pages (from-to) | 798-803 |

Number of pages | 6 |

Journal | Journal of Electronic Materials |

Volume | 29 |

Issue number | 6 |

Publication status | Published - 2000 Jun 1 |

Externally published | Yes |

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### ASJC Scopus subject areas

- Electrical and Electronic Engineering
- Materials Science(all)
- Electronic, Optical and Magnetic Materials
- Physics and Astronomy (miscellaneous)

### Cite this

_{1-x}Zn

_{x}Te alloys.

*Journal of Electronic Materials*,

*29*(6), 798-803.