Precise measurements of the dispersion of the index of refraction for Cd1-xZnxTe alloys

F. C. Peiris, Sang Hoon Lee, U. Bindley, J. K. Furdyna

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

By using a prism coupler technique in conjunction with reflectivity measurements, we have obtained highly accurate relations for the dispersion of the indices of refraction n for a series of MBE-grown Cd1-xZnxTe alloys. Initially, the prism coupler technique was used to determine n at discrete wavelengths with an accuracy of at least 0.1%, and also to concurrently determine the epilayer thicknesses with an uncertainty of less than 0.5%. Having obtained precise values for both n (at discrete wavelengths) and the thicknesses of the Cd1-xZnxTe epilayers, we were then able to correctly decipher the values for n at the maxima and minima of the reflectivity spectra observed on the above epilayers, and thereby generate a continuous variation of the indices of refraction as a function of wavelength. Fitting the dispersion of n in each alloy to a Sellmeier-type dispersion relation, we have obtained the dependence of the constants appearing in this relation on the alloy concentration. This enables one to predict n not only as a function of wavelength, but also as a function of alloy composition.

Original languageEnglish
Pages (from-to)798-803
Number of pages6
JournalJournal of Electronic Materials
Volume29
Issue number6
Publication statusPublished - 2000 Jun 1
Externally publishedYes

Fingerprint

Refraction
Epilayers
refraction
Wavelength
Prisms
wavelengths
couplers
prisms
reflectance
Molecular beam epitaxy
Chemical analysis

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Materials Science(all)
  • Electronic, Optical and Magnetic Materials
  • Physics and Astronomy (miscellaneous)

Cite this

Precise measurements of the dispersion of the index of refraction for Cd1-xZnxTe alloys. / Peiris, F. C.; Lee, Sang Hoon; Bindley, U.; Furdyna, J. K.

In: Journal of Electronic Materials, Vol. 29, No. 6, 01.06.2000, p. 798-803.

Research output: Contribution to journalArticle

Peiris, F. C. ; Lee, Sang Hoon ; Bindley, U. ; Furdyna, J. K. / Precise measurements of the dispersion of the index of refraction for Cd1-xZnxTe alloys. In: Journal of Electronic Materials. 2000 ; Vol. 29, No. 6. pp. 798-803.
@article{5c4f5c4c194a433f8da59f678ac9c9bd,
title = "Precise measurements of the dispersion of the index of refraction for Cd1-xZnxTe alloys",
abstract = "By using a prism coupler technique in conjunction with reflectivity measurements, we have obtained highly accurate relations for the dispersion of the indices of refraction n for a series of MBE-grown Cd1-xZnxTe alloys. Initially, the prism coupler technique was used to determine n at discrete wavelengths with an accuracy of at least 0.1{\%}, and also to concurrently determine the epilayer thicknesses with an uncertainty of less than 0.5{\%}. Having obtained precise values for both n (at discrete wavelengths) and the thicknesses of the Cd1-xZnxTe epilayers, we were then able to correctly decipher the values for n at the maxima and minima of the reflectivity spectra observed on the above epilayers, and thereby generate a continuous variation of the indices of refraction as a function of wavelength. Fitting the dispersion of n in each alloy to a Sellmeier-type dispersion relation, we have obtained the dependence of the constants appearing in this relation on the alloy concentration. This enables one to predict n not only as a function of wavelength, but also as a function of alloy composition.",
author = "Peiris, {F. C.} and Lee, {Sang Hoon} and U. Bindley and Furdyna, {J. K.}",
year = "2000",
month = "6",
day = "1",
language = "English",
volume = "29",
pages = "798--803",
journal = "Journal of Electronic Materials",
issn = "0361-5235",
publisher = "Springer New York",
number = "6",

}

TY - JOUR

T1 - Precise measurements of the dispersion of the index of refraction for Cd1-xZnxTe alloys

AU - Peiris, F. C.

AU - Lee, Sang Hoon

AU - Bindley, U.

AU - Furdyna, J. K.

PY - 2000/6/1

Y1 - 2000/6/1

N2 - By using a prism coupler technique in conjunction with reflectivity measurements, we have obtained highly accurate relations for the dispersion of the indices of refraction n for a series of MBE-grown Cd1-xZnxTe alloys. Initially, the prism coupler technique was used to determine n at discrete wavelengths with an accuracy of at least 0.1%, and also to concurrently determine the epilayer thicknesses with an uncertainty of less than 0.5%. Having obtained precise values for both n (at discrete wavelengths) and the thicknesses of the Cd1-xZnxTe epilayers, we were then able to correctly decipher the values for n at the maxima and minima of the reflectivity spectra observed on the above epilayers, and thereby generate a continuous variation of the indices of refraction as a function of wavelength. Fitting the dispersion of n in each alloy to a Sellmeier-type dispersion relation, we have obtained the dependence of the constants appearing in this relation on the alloy concentration. This enables one to predict n not only as a function of wavelength, but also as a function of alloy composition.

AB - By using a prism coupler technique in conjunction with reflectivity measurements, we have obtained highly accurate relations for the dispersion of the indices of refraction n for a series of MBE-grown Cd1-xZnxTe alloys. Initially, the prism coupler technique was used to determine n at discrete wavelengths with an accuracy of at least 0.1%, and also to concurrently determine the epilayer thicknesses with an uncertainty of less than 0.5%. Having obtained precise values for both n (at discrete wavelengths) and the thicknesses of the Cd1-xZnxTe epilayers, we were then able to correctly decipher the values for n at the maxima and minima of the reflectivity spectra observed on the above epilayers, and thereby generate a continuous variation of the indices of refraction as a function of wavelength. Fitting the dispersion of n in each alloy to a Sellmeier-type dispersion relation, we have obtained the dependence of the constants appearing in this relation on the alloy concentration. This enables one to predict n not only as a function of wavelength, but also as a function of alloy composition.

UR - http://www.scopus.com/inward/record.url?scp=0033686785&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0033686785&partnerID=8YFLogxK

M3 - Article

VL - 29

SP - 798

EP - 803

JO - Journal of Electronic Materials

JF - Journal of Electronic Materials

SN - 0361-5235

IS - 6

ER -