### Abstract

By using a prism coupler technique in conjunction with reflectivity measurements, we have obtained highly accurate relations for the dispersion of the indices of refraction n for a series of MBE-grown Cd_{1-x}Zn_{x}Te alloys. Initially, the prism coupler technique was used to determine n at discrete wavelengths with an accuracy of at least 0.1%, and also to concurrently determine the epilayer thicknesses with an uncertainty of less than 0.5%. Having obtained precise values for both n (at discrete wavelengths) and the thicknesses of the Cd_{1-x}Zn_{x}Te epilayers, we were then able to correctly decipher the values for n at the maxima and minima of the reflectivity spectra observed on the above epilayers, and thereby generate a continuous variation of the indices of refraction as a function of wavelength. Fitting the dispersion of n in each alloy to a Sellmeier-type dispersion relation, we have obtained the dependence of the constants appearing in this relation on the alloy concentration. This enables one to predict n not only as a function of wavelength, but also as a function of alloy composition.

Original language | English |
---|---|

Pages (from-to) | 798-803 |

Number of pages | 6 |

Journal | Journal of Electronic Materials |

Volume | 29 |

Issue number | 6 |

Publication status | Published - 2000 Jun 1 |

Externally published | Yes |

### Fingerprint

### ASJC Scopus subject areas

- Electrical and Electronic Engineering
- Materials Science(all)
- Electronic, Optical and Magnetic Materials
- Physics and Astronomy (miscellaneous)

### Cite this

_{1-x}Zn

_{x}Te alloys.

*Journal of Electronic Materials*,

*29*(6), 798-803.

**Precise measurements of the dispersion of the index of refraction for Cd _{1-x}Zn_{x}Te alloys.** / Peiris, F. C.; Lee, Sang Hoon; Bindley, U.; Furdyna, J. K.

Research output: Contribution to journal › Article

_{1-x}Zn

_{x}Te alloys',

*Journal of Electronic Materials*, vol. 29, no. 6, pp. 798-803.

_{1-x}Zn

_{x}Te alloys. Journal of Electronic Materials. 2000 Jun 1;29(6):798-803.

}

TY - JOUR

T1 - Precise measurements of the dispersion of the index of refraction for Cd1-xZnxTe alloys

AU - Peiris, F. C.

AU - Lee, Sang Hoon

AU - Bindley, U.

AU - Furdyna, J. K.

PY - 2000/6/1

Y1 - 2000/6/1

N2 - By using a prism coupler technique in conjunction with reflectivity measurements, we have obtained highly accurate relations for the dispersion of the indices of refraction n for a series of MBE-grown Cd1-xZnxTe alloys. Initially, the prism coupler technique was used to determine n at discrete wavelengths with an accuracy of at least 0.1%, and also to concurrently determine the epilayer thicknesses with an uncertainty of less than 0.5%. Having obtained precise values for both n (at discrete wavelengths) and the thicknesses of the Cd1-xZnxTe epilayers, we were then able to correctly decipher the values for n at the maxima and minima of the reflectivity spectra observed on the above epilayers, and thereby generate a continuous variation of the indices of refraction as a function of wavelength. Fitting the dispersion of n in each alloy to a Sellmeier-type dispersion relation, we have obtained the dependence of the constants appearing in this relation on the alloy concentration. This enables one to predict n not only as a function of wavelength, but also as a function of alloy composition.

AB - By using a prism coupler technique in conjunction with reflectivity measurements, we have obtained highly accurate relations for the dispersion of the indices of refraction n for a series of MBE-grown Cd1-xZnxTe alloys. Initially, the prism coupler technique was used to determine n at discrete wavelengths with an accuracy of at least 0.1%, and also to concurrently determine the epilayer thicknesses with an uncertainty of less than 0.5%. Having obtained precise values for both n (at discrete wavelengths) and the thicknesses of the Cd1-xZnxTe epilayers, we were then able to correctly decipher the values for n at the maxima and minima of the reflectivity spectra observed on the above epilayers, and thereby generate a continuous variation of the indices of refraction as a function of wavelength. Fitting the dispersion of n in each alloy to a Sellmeier-type dispersion relation, we have obtained the dependence of the constants appearing in this relation on the alloy concentration. This enables one to predict n not only as a function of wavelength, but also as a function of alloy composition.

UR - http://www.scopus.com/inward/record.url?scp=0033686785&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0033686785&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0033686785

VL - 29

SP - 798

EP - 803

JO - Journal of Electronic Materials

JF - Journal of Electronic Materials

SN - 0361-5235

IS - 6

ER -