Principles of perfect and ultrathin anti-reflection with applications to transparent electrode

Kyoung Ho Kim, Q. Han Park

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Anti-reflection(AR), a well-known technique of reducing unwanted reflections by applying an impedance matching layer, works for a specific wavelength and require the coating layer to be a quarter wavelength thick. A broadband operation of AR, however, is not fully understood except for the trial and error method. Here, we present a systematic analytic method of AR without the restriction of wavelength or thickness, i.e. achieving a perfect AR. Specifically, we find analytic permittivity and permeability profiles that remove any given impedance mismatch at the interface between two different dielectrics in a frequency independent way. Ultra-thin AR coating is also shown to be possible and confirmed experimentally with the l/25-wavelength thick AR coating layer made of metamaterials. We apply the concept of ultrathin double layer AR to the transparent conducting electrode, which we demonstrate by fabricating a low reflective dielectric/metal-layered electrode that provides significant electrical conductivity and light transparency.

Original languageEnglish
Title of host publicationUltrafast Phenomena and Nanophotonics XVIII
DOIs
Publication statusPublished - 2014 Apr 14
EventUltrafast Phenomena and Nanophotonics XVIII - San Francisco, CA, United States
Duration: 2014 Feb 22014 Feb 5

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8984
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherUltrafast Phenomena and Nanophotonics XVIII
CountryUnited States
CitySan Francisco, CA
Period14/2/214/2/5

Keywords

  • Anti-reflection
  • broadband
  • dispersive permittivity
  • metamaterial
  • transparent conducting electrode

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Kim, K. H., & Park, Q. H. (2014). Principles of perfect and ultrathin anti-reflection with applications to transparent electrode. In Ultrafast Phenomena and Nanophotonics XVIII [89840V] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8984). https://doi.org/10.1117/12.2036070