Principles of perfect and ultrathin anti-reflection with applications to transparent electrode

Kyoung Ho Kim, Q Han Park

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Anti-reflection(AR), a well-known technique of reducing unwanted reflections by applying an impedance matching layer, works for a specific wavelength and require the coating layer to be a quarter wavelength thick. A broadband operation of AR, however, is not fully understood except for the trial and error method. Here, we present a systematic analytic method of AR without the restriction of wavelength or thickness, i.e. achieving a perfect AR. Specifically, we find analytic permittivity and permeability profiles that remove any given impedance mismatch at the interface between two different dielectrics in a frequency independent way. Ultra-thin AR coating is also shown to be possible and confirmed experimentally with the l/25-wavelength thick AR coating layer made of metamaterials. We apply the concept of ultrathin double layer AR to the transparent conducting electrode, which we demonstrate by fabricating a low reflective dielectric/metal-layered electrode that provides significant electrical conductivity and light transparency.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume8984
DOIs
Publication statusPublished - 2014 Apr 14
EventUltrafast Phenomena and Nanophotonics XVIII - San Francisco, CA, United States
Duration: 2014 Feb 22014 Feb 5

Other

OtherUltrafast Phenomena and Nanophotonics XVIII
CountryUnited States
CitySan Francisco, CA
Period14/2/214/2/5

Fingerprint

Electrode
Electrodes
electrodes
Wavelength
Antireflection Coating
Antireflection coatings
antireflection coatings
Impedance
wavelengths
Trial and error
Metamaterials
Electrical Conductivity
Permittivity
Transparency
impedance matching
Permeability
Broadband
Coating
Metals
constrictions

Keywords

  • Anti-reflection
  • broadband
  • dispersive permittivity
  • metamaterial
  • transparent conducting electrode

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Kim, K. H., & Park, Q. H. (2014). Principles of perfect and ultrathin anti-reflection with applications to transparent electrode. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 8984). [89840V] https://doi.org/10.1117/12.2036070

Principles of perfect and ultrathin anti-reflection with applications to transparent electrode. / Kim, Kyoung Ho; Park, Q Han.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 8984 2014. 89840V.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kim, KH & Park, QH 2014, Principles of perfect and ultrathin anti-reflection with applications to transparent electrode. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 8984, 89840V, Ultrafast Phenomena and Nanophotonics XVIII, San Francisco, CA, United States, 14/2/2. https://doi.org/10.1117/12.2036070
Kim KH, Park QH. Principles of perfect and ultrathin anti-reflection with applications to transparent electrode. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 8984. 2014. 89840V https://doi.org/10.1117/12.2036070
Kim, Kyoung Ho ; Park, Q Han. / Principles of perfect and ultrathin anti-reflection with applications to transparent electrode. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 8984 2014.
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