Prismatic punching defects in CdTe compounds

K. H. Kim, A. E. Bolotnikov, G. S. Camarda, J. Franc, P. Fochuk, R. B. James

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

The origin and nature of star-shaped prismatic punching defects (PPDs) were analyzed by white-beam X-ray diffraction topography (WBXDT) and photoluminescence (PL) measurements. PPDs were observed in CdTe-based compounds that had Te-rich secondary phase defects and were annealed only under Cd overpressure. The evolutional features of the PPDs during annealing were similar to those of a diffusion process, that is, the in-diffusion of Cd vapor via Cd vacancies. PL mapping around the PPDs reveals that the stoichiometry of PPDs is the same as that of a normal matrix, and that PPDs are just structural defects with non-radiative emission induced by the exothermic reaction between Cd and Te. We find that Te-rich secondary phase defects can be removed without the generation of star-shaped PPDs, if the exothermic reaction rate can be slowed down to reduce the thermal gradient between the Te-rich region and the surrounding matrix.

Original languageEnglish
Pages (from-to)1-4
Number of pages4
JournalJournal of Crystal Growth
Volume390
DOIs
Publication statusPublished - 2014 Mar 15

Keywords

  • A1. Defects
  • A2. Bridgman technique
  • B1. Cadmium compounds
  • B2. Semiconducting II-VI materials

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Inorganic Chemistry
  • Materials Chemistry

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    Kim, K. H., Bolotnikov, A. E., Camarda, G. S., Franc, J., Fochuk, P., & James, R. B. (2014). Prismatic punching defects in CdTe compounds. Journal of Crystal Growth, 390, 1-4. https://doi.org/10.1016/j.jcrysgro.2013.12.015