Pulsed laser deposited Na0.5K0.5NbO3 thin films

Chong Rae Cho, Alex Grishin, Byung Moo Moon

Research output: Contribution to journalConference article

1 Citation (Scopus)

Abstract

Na0.5K0.5NbO3 films have been grown onto polycrystalline Pt80Ir20 substrates at two different regimes: high (approx. 400 m Torr) and low (approx. 10 mTorr) oxygen pressure. Films grown at high oxygen pressure have been found to be single phase and highly c-axis oriented. The concept of discriminated thermalization has been developed to explain the dynamics of the laser ablation process and to find reliable pulsed laser deposition (PLD) processing conditions. The phenomenon of self assembling of Na0.5K0.5NbO3 films along [001] direction has been observed. On the other hand, films grown at low oxygen pressure have been found to be mixed phase of ferroelectric Na0.5K0.5NbO3 and paraelectric potassium niobates. Superparaelectric behavior has been observed in these films: 5% tunability at electric field of 100 kV/cm, losses as low as 0.003 and excellent stability to the temperature and frequency changes.

Original languageEnglish
Pages (from-to)149-154
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume603
Publication statusPublished - 2000
EventMaterials issues for Tunable RF and Microwave Devices - Boston, MA, USA
Duration: 1999 Nov 301999 Dec 2

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Fingerprint Dive into the research topics of 'Pulsed laser deposited Na<sub>0.5</sub>K<sub>0.5</sub>NbO<sub>3</sub> thin films'. Together they form a unique fingerprint.

  • Cite this