Quantitative scanning thermal microscopy using double scan technique

Kyeongtae Kim, Jaehoon Chung, Jongbo Won, Oh Myoung Kwon, Joon Sik Lee, Seung Ho Park, Young Ki Choi

Research output: Contribution to journalArticle

47 Citations (Scopus)

Abstract

Although scanning thermal microscope has shown the highest spatial resolution in local temperature and thermophysical property measurement, its usefulness has been severely limited due to difficulties in quantitative measurement. We propose a double scan technique that measures temperature only from the heat transfer through the tip-sample contact by the subtraction of the signal due to the heat transfer through the air. A rigorous theoretical model for this technique is derived. The effectiveness of the double scan technique in quantitative temperature measurement is demonstrated experimentally.

Original languageEnglish
Article number203115
JournalApplied Physics Letters
Volume93
Issue number20
DOIs
Publication statusPublished - 2008 Dec 2

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heat transfer
microscopy
scanning
thermophysical properties
subtraction
temperature measurement
spatial resolution
microscopes
temperature
high resolution
air

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Kim, K., Chung, J., Won, J., Kwon, O. M., Lee, J. S., Park, S. H., & Choi, Y. K. (2008). Quantitative scanning thermal microscopy using double scan technique. Applied Physics Letters, 93(20), [203115]. https://doi.org/10.1063/1.3033545

Quantitative scanning thermal microscopy using double scan technique. / Kim, Kyeongtae; Chung, Jaehoon; Won, Jongbo; Kwon, Oh Myoung; Lee, Joon Sik; Park, Seung Ho; Choi, Young Ki.

In: Applied Physics Letters, Vol. 93, No. 20, 203115, 02.12.2008.

Research output: Contribution to journalArticle

Kim, K, Chung, J, Won, J, Kwon, OM, Lee, JS, Park, SH & Choi, YK 2008, 'Quantitative scanning thermal microscopy using double scan technique', Applied Physics Letters, vol. 93, no. 20, 203115. https://doi.org/10.1063/1.3033545
Kim, Kyeongtae ; Chung, Jaehoon ; Won, Jongbo ; Kwon, Oh Myoung ; Lee, Joon Sik ; Park, Seung Ho ; Choi, Young Ki. / Quantitative scanning thermal microscopy using double scan technique. In: Applied Physics Letters. 2008 ; Vol. 93, No. 20.
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