Quantitative Scanning Thermal microscopy with double scan technique

Kyeongtae Kim, Seungpil Jaung, Jaehoon Chung, Jongbo Won, Ohmyoung Kwon, Joon Sik Lee, Seungho Park, Young Ki Choi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Scanning Thermal Microscope (SThM) is known as a tool of the highest spatial resolution in measuring local temperature and thermophysical properties. However, despite the highest spatial resolution of SThM, its usefulness has been limited because of the difficulties related to the quantitative interpretation of the measured data. We suggest a double scan technique that can make an advantage of heat transfer through the tip-sample contact by subtraction of air conduction signal obtained from 'lift mode' scan. The thermal signal obtained by the new method is free from the influence of air conduction. This, in turn, allowed the quantitative profiling of the sample temperature.

Original languageEnglish
Title of host publication2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008
Pages899-904
Number of pages6
DOIs
Publication statusPublished - 2008
Event1st ASME Micro/Nanoscale Heat Transfer International Conference, MNHT08 - Tainan, Taiwan, Province of China
Duration: 2008 Jan 62008 Jan 9

Publication series

Name2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008
VolumePART B

Conference

Conference1st ASME Micro/Nanoscale Heat Transfer International Conference, MNHT08
CountryTaiwan, Province of China
CityTainan
Period08/1/608/1/9

Keywords

  • AFM
  • Nanoscale temperature
  • SThM (Scanning Thermal Microscope)
  • Thermoelectric probe

ASJC Scopus subject areas

  • Mechanics of Materials
  • Materials Science(all)
  • Condensed Matter Physics
  • Atomic and Molecular Physics, and Optics

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