Quantitative temperature mapping of carbon nanotube using null point method

Jaehun Chung, Kyeongtae Kim, Kwangseok Hwang, Oh Myoung Kwon, Young Ki Choi, Seungwon Jung, Jungnoon Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Despite the high spatial resolution of scanning thermal microscope, its usefulness has been limited because of its lack of quantitative measurement. In this study, utilizing the principle of double scan technique, we developed the null-point method by which one can measure the temperature of a nanoscale sample quantitatively without the disturbances due to the heat transfer through the air and the variation of tip-sample conductance caused by the change of tip-sample contact area. We first checked the effectiveness and accuracy of null point method using 5 μm and 400 nm wide aluminium line whose temperature can be easily controlled and measured. Then, we measured the temperature of electrically heated multi-walled carbon nanotube (MWCNT) via null point method and the temperature profile around it using double scan technique.

Original languageEnglish
Title of host publication2010 10th IEEE Conference on Nanotechnology, NANO 2010
Pages722-726
Number of pages5
DOIs
Publication statusPublished - 2010 Dec 1
Event2010 10th IEEE Conference on Nanotechnology, NANO 2010 - Ilsan, Gyeonggi-Do, Korea, Republic of
Duration: 2010 Aug 172010 Aug 20

Other

Other2010 10th IEEE Conference on Nanotechnology, NANO 2010
CountryKorea, Republic of
CityIlsan, Gyeonggi-Do
Period10/8/1710/8/20

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ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Chung, J., Kim, K., Hwang, K., Kwon, O. M., Choi, Y. K., Jung, S., & Lee, J. (2010). Quantitative temperature mapping of carbon nanotube using null point method. In 2010 10th IEEE Conference on Nanotechnology, NANO 2010 (pp. 722-726). [5697812] https://doi.org/10.1109/NANO.2010.5697812