Quantitative temperature profiling through null-point scanning thermal microscopy

J. Chung, K. Kim, G. Hwang, Oh Myoung Kwon, Y. K. Choi, J. S. Lee

Research output: Contribution to journalArticle

23 Citations (Scopus)

Abstract

We develop and demonstrate the theory and method of null-point scanning thermal microscopy, which can obtain quantitative temperature profiles even when the heat conductance between the tip and the sample is disturbed due to abrupt changes in the surface topography or properties. Due to its generality, it would be widely applicable for a variety of problems associated with the thermal characterization of nanomaterials and nanodevices.

Original languageEnglish
Pages (from-to)109-113
Number of pages5
JournalInternational Journal of Thermal Sciences
Volume62
DOIs
Publication statusPublished - 2012 Dec 1

Fingerprint

temperature profiles
Microscopic examination
topography
microscopy
Scanning
heat
scanning
Surface topography
Nanostructured materials
Temperature
Surface properties
temperature
Hot Temperature

Keywords

  • Nanoscale thermal measurement
  • Null-point method
  • Quantitative temperature profiling
  • Scanning thermal microscopy (SThM)
  • Thermal conductance
  • Thermometry

ASJC Scopus subject areas

  • Engineering(all)
  • Condensed Matter Physics

Cite this

Quantitative temperature profiling through null-point scanning thermal microscopy. / Chung, J.; Kim, K.; Hwang, G.; Kwon, Oh Myoung; Choi, Y. K.; Lee, J. S.

In: International Journal of Thermal Sciences, Vol. 62, 01.12.2012, p. 109-113.

Research output: Contribution to journalArticle

Chung, J. ; Kim, K. ; Hwang, G. ; Kwon, Oh Myoung ; Choi, Y. K. ; Lee, J. S. / Quantitative temperature profiling through null-point scanning thermal microscopy. In: International Journal of Thermal Sciences. 2012 ; Vol. 62. pp. 109-113.
@article{a49cabc04d784e2d86f9eb1a41feefba,
title = "Quantitative temperature profiling through null-point scanning thermal microscopy",
abstract = "We develop and demonstrate the theory and method of null-point scanning thermal microscopy, which can obtain quantitative temperature profiles even when the heat conductance between the tip and the sample is disturbed due to abrupt changes in the surface topography or properties. Due to its generality, it would be widely applicable for a variety of problems associated with the thermal characterization of nanomaterials and nanodevices.",
keywords = "Nanoscale thermal measurement, Null-point method, Quantitative temperature profiling, Scanning thermal microscopy (SThM), Thermal conductance, Thermometry",
author = "J. Chung and K. Kim and G. Hwang and Kwon, {Oh Myoung} and Choi, {Y. K.} and Lee, {J. S.}",
year = "2012",
month = "12",
day = "1",
doi = "10.1016/j.ijthermalsci.2011.11.012",
language = "English",
volume = "62",
pages = "109--113",
journal = "International Journal of Thermal Sciences",
issn = "1290-0729",
publisher = "Elsevier Masson SAS",

}

TY - JOUR

T1 - Quantitative temperature profiling through null-point scanning thermal microscopy

AU - Chung, J.

AU - Kim, K.

AU - Hwang, G.

AU - Kwon, Oh Myoung

AU - Choi, Y. K.

AU - Lee, J. S.

PY - 2012/12/1

Y1 - 2012/12/1

N2 - We develop and demonstrate the theory and method of null-point scanning thermal microscopy, which can obtain quantitative temperature profiles even when the heat conductance between the tip and the sample is disturbed due to abrupt changes in the surface topography or properties. Due to its generality, it would be widely applicable for a variety of problems associated with the thermal characterization of nanomaterials and nanodevices.

AB - We develop and demonstrate the theory and method of null-point scanning thermal microscopy, which can obtain quantitative temperature profiles even when the heat conductance between the tip and the sample is disturbed due to abrupt changes in the surface topography or properties. Due to its generality, it would be widely applicable for a variety of problems associated with the thermal characterization of nanomaterials and nanodevices.

KW - Nanoscale thermal measurement

KW - Null-point method

KW - Quantitative temperature profiling

KW - Scanning thermal microscopy (SThM)

KW - Thermal conductance

KW - Thermometry

UR - http://www.scopus.com/inward/record.url?scp=84867745015&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84867745015&partnerID=8YFLogxK

U2 - 10.1016/j.ijthermalsci.2011.11.012

DO - 10.1016/j.ijthermalsci.2011.11.012

M3 - Article

AN - SCOPUS:84867745015

VL - 62

SP - 109

EP - 113

JO - International Journal of Thermal Sciences

JF - International Journal of Thermal Sciences

SN - 1290-0729

ER -