Radiation hardened successive-approximation ADC with error detection circuits

Inyong Kwon, Chang Hwoi Kim, Yongseok Lee, Jungyeol Yeom

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

For several decades, radiation-hardened-by-design (RHBD) techniques have been developed to meet the design requirements of irradiating environment in nuclear power plants. Improvements on the circuit side for radiation sensors in performance, chip size, and radiation hardening ability have been adopted in current plant systems; however, next generation reactors and/or preparation for severe events in existing reactors require advanced circuit structures that can provide relatively long viability in harsh conditions. In order to maintain performances of electronics in high radiating environments, we propose to develop a small-area, low resource-overhead data-converter architecture that is immune to radiation impact events, an architecture that includes three kinds of novel radiation-hardened (rad-hard) designs for each analog and digital circuit in an ADC structure: a) error detectable tri-state buffer for flip flop against DSET, b) error detection storage in flip flop against SEU, and c) analog algorithm for the analog parts of an SAR ADC. The novel ADC architecture including the three RHBD techniques was implemented in a standard 180 nm CMOS technology with a 1.8 V supply voltage. Simulation results show that the techniques can successfully recognize errors induced by radiation impact events. The static power consumption was 123 μW with the sampling rate 36 MS/s and resolution of 8 bits. The performances could be highly advanced under fine-tune designs.

Original languageEnglish
Title of host publication10th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2017
PublisherAmerican Nuclear Society
Pages1013-1022
Number of pages10
ISBN (Electronic)9781510851160
Publication statusPublished - 2017 Jan 1
Event10th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2017 - San Francisco, United States
Duration: 2017 Jun 112017 Jun 15

Publication series

Name10th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2017
Volume2

Conference

Conference10th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2017
CountryUnited States
CitySan Francisco
Period17/6/1117/6/15

Fingerprint

Error detection
Radiation
Networks (circuits)
Flip flop circuits
Radiation hardening
Digital circuits
Analog circuits
Nuclear power plants
Electric power utilization
Electronic equipment
Sampling
Sensors
Electric potential

Keywords

  • Harsh environment
  • NPP
  • RHBD
  • SAR ADC
  • SEE
  • SEU

ASJC Scopus subject areas

  • Human-Computer Interaction
  • Nuclear Energy and Engineering
  • Energy Engineering and Power Technology

Cite this

Kwon, I., Kim, C. H., Lee, Y., & Yeom, J. (2017). Radiation hardened successive-approximation ADC with error detection circuits. In 10th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2017 (pp. 1013-1022). (10th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2017; Vol. 2). American Nuclear Society.

Radiation hardened successive-approximation ADC with error detection circuits. / Kwon, Inyong; Kim, Chang Hwoi; Lee, Yongseok; Yeom, Jungyeol.

10th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2017. American Nuclear Society, 2017. p. 1013-1022 (10th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2017; Vol. 2).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kwon, I, Kim, CH, Lee, Y & Yeom, J 2017, Radiation hardened successive-approximation ADC with error detection circuits. in 10th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2017. 10th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2017, vol. 2, American Nuclear Society, pp. 1013-1022, 10th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2017, San Francisco, United States, 17/6/11.
Kwon I, Kim CH, Lee Y, Yeom J. Radiation hardened successive-approximation ADC with error detection circuits. In 10th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2017. American Nuclear Society. 2017. p. 1013-1022. (10th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2017).
Kwon, Inyong ; Kim, Chang Hwoi ; Lee, Yongseok ; Yeom, Jungyeol. / Radiation hardened successive-approximation ADC with error detection circuits. 10th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2017. American Nuclear Society, 2017. pp. 1013-1022 (10th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies, NPIC and HMIT 2017).
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