Real-time inspection system for printed circuit boards

N. H. Kim, J. Y. Pyun, K. S. Choi, B. D. Choi, Sung-Jea Ko

Research output: Chapter in Book/Report/Conference proceedingConference contribution

14 Citations (Scopus)

Abstract

The PCB inspection system presented in this paper can detect defects including the breaks in the wires and short circuit and is significantly faster when compared to the existing techniques. The proposed inspection method is based on referential matching between the stored reference image and the test (observed) image. Block matching is performed to solve the misalignment in referential matching. In order to reduce the computational complexity, we implement the proposed algorithm using the Single Instruction Multiple Data (SIMD) instructions, so called SSE2.

Original languageEnglish
Title of host publicationIEEE International Symposium on Industrial Electronics
Pages166-170
Number of pages5
Volume1
Publication statusPublished - 2001 Jan 1
Event2001 IEEE International Symposium on Industrial Electronics Proceedings (ISIE 2001) - Pusan, Korea, Republic of
Duration: 2001 Jun 122001 Jun 16

Other

Other2001 IEEE International Symposium on Industrial Electronics Proceedings (ISIE 2001)
CountryKorea, Republic of
CityPusan
Period01/6/1201/6/16

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Kim, N. H., Pyun, J. Y., Choi, K. S., Choi, B. D., & Ko, S-J. (2001). Real-time inspection system for printed circuit boards. In IEEE International Symposium on Industrial Electronics (Vol. 1, pp. 166-170)